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Author |
Title |
Year |
Publication |
Volume |
Pages |
Links |
|
|
Korneev, A.; Divochiy, A.; Tarkhov, M.; Minaeva, O.; Seleznev, V.; Kaurova, N.; Voronov, B.; Okunev, O.; Chulkova, G.; Milostnaya, I.; Smirnov, K.; Gol’tsman, G. |
Superconducting NbN-nanowire single-photon detectors capable of photon number resolving |
2008 |
Supercond. News Forum |
|
|
|
|
|
Ozhegov, R.; Elezov, M.; Kurochkin, Y.; Kurochkin, V.; Divochiy, A.; Kovalyuk, V.; Vachtomin, Y.; Smirnov, K.; Goltsman, G. |
Quantum key distribution over 300 |
2014 |
Proc. SPIE |
9440 |
1F (1 to 9) |
|
|
|
Smirnov, K. V.; Vakhtomin, Yu. B.; Divochiy, A. V.; Ozhegov, R. V.; Pentin, I. V.; Slivinskaya, E. V.; Tarkhov, M. A.; Gol’tsman, G. N. |
Single-photon detectors for the visible and infrared parts of the spectrum based on NbN nanostructures |
2009 |
Proc. Progress In Electromagnetics Research Symp. |
|
863-864 |
|
|
|
Manus, M. K. Mc; Kash, J. A.; Steen, S. E.; Polonsky, S.; Tsang, J.C.; Knebel, D. R.; Huott, W. |
PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis |
2000 |
Microelectronics Reliability |
40 |
1353-1358 |
|
|
|
Stellari, Franco; Song, Peilin |
Testing of ultra low voltage CMOS microprocessors using the superconducting single-photon detector (SSPD) |
2005 |
Proc. 12th IPFA |
|
2 |
|
