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Author Масленникова, А. В.; Рябчун, С. А.; Финкель, М. И.; Каурова, Н. С.; Исупова, А. А.; Воронов, Б. М.; Гольцман, Г. Н. openurl 
  Title Широкополосные смесители на горячих электронах на основе NbN наноструктур Type Journal Article
  Year 2011 Publication Труды Московского физико-технического института Abbreviated Journal Труды МФТИ  
  Volume 3 Issue (down) 2 Pages 31-34  
  Keywords HEB mixer  
  Abstract Мы приводим данные исследования полосы преобразования смесителей на горячих электронах (hot-electron bolometer, НЕВ), изготовленных на основе тонких пленок NbN. Зависимость полосы преобразования от длины смесительного элемента находится в прекрасном согласии с результатами теоретической модели HEB-смесителя, в котором энергетическая релаксация электронов одновременно происходит по двум каналам: фононному и диффузионному.  
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  Notes Approved no  
  Call Number RPLAB @ gujma @ Serial 646  
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Author Stevens, Martin J.; Baek, Burm; Dauler, Eric A.; Kerman, Andrew J.; Molnar, Richard J.; Hamilton, Scott A.; Berggren, Karl K.; Mirin, Richard P.; Nam, Sae Woo openurl 
  Title High-order temporal coherences of
chaotic and laser light Type Journal Article
  Year 2010 Publication Optics Express Abbreviated Journal Opt. Express  
  Volume 18 Issue (down) 2 Pages 1430-1437  
  Keywords SNSPD  
  Abstract We demonstrate a new approach to measuring high-order temporal coherences that uses a four-element superconducting nanowire single-photon detector. The four independent, interleaved single-photon-sensitive elements parse a single spatial mode of an optical beam over dimensions smaller than the minimum diffraction-limited spot size. Integrating this device with four-channel time-tagging electronics to generate multi-start, multi-stop histograms enables measurement of temporal coherences up to fourth order for a continuous range of all associated time delays. We observe high-order photon bunching from a chaotic, pseudo-thermal light source, measuring maximum third- and fourth-order coherence values of 5.87 ± 0.17 and 23.1 ± 1.8, respectively, in agreement with the theoretically predicted values of 3! = 6 and 4! = 24. Laser light, by contrast, is confirmed to have coherence values of approximately 1 for second, third and fourth orders at all time delays.  
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  Notes SSPD Approved no  
  Call Number RPLAB @ gujma @ Serial 685  
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Author Mannino, Giovanni; Spinella, Corrado; Ruggeri, Rosa; La Magna, Antonino; Fisicaro, Giuseppe; Fazio, Enza; Neri, Fortunato; Privitera, Vittorio openurl 
  Title Crystallization of implanted amorphous silicon during millisecond annealing by infrared laser irradiation Type Journal Article
  Year 2010 Publication Applied Physics Letters Abbreviated Journal Appl. Phys. Lett.  
  Volume 97 Issue (down) 2 Pages 3  
  Keywords Annealing  
  Abstract We investigated the homogenous nucleation of crystalline grains in amorphous Si during transient temperature pulse of few milliseconds IR laser irradiation. The crystallized volume fraction is ~80%. Significant crystallization occurs in nonsteady regime because of the rapid temperature variation (106 °C/s). Our model combines the time evolution of the crystal grain population with the consumption of the amorphous volume due to the growth of grains. Thanks to the experimental approach based on a laser source to heat α-Si and the theoretical model we extended the description of the spontaneous crystallization up to 1323 K or 250 K above the temperature investigated by conventional annealing.  
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  Notes Annealing Approved no  
  Call Number RPLAB @ gujma @ Serial 691  
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Author Jang, Young Rae; Yoo, Keon-Ho; Park, Seung Min openurl 
  Title Rapid thermal annealing of ZnO thin films grown at room temperature Type Journal Article
  Year 2010 Publication J. Vac. Sci. Technol. A Abbreviated Journal  
  Volume 28 Issue (down) 2 Pages 4  
  Keywords Annealing  
  Abstract The authors successfully obtained high quality ZnO thin films by growing them at room temperature (RT) and postannealing by rapid thermal annealing (RTA). The thin films were grown by pulsed laser deposition on Si (100) substrates at RT, and RTA was performed under various temperatures and ambient conditions. Based on the UV emission to visible emission ratio in RT photoluminescence (PL) spectra, the optimum film was obtained at annealing temperature ~700 °C in an ambient of Ar, N2, or O2 at 0.1 Torr, while the optimum annealing temperature was above 1100 °C in the air ambient at atmospheric pressure. The morphology and structure of the films in different RTA conditions were investigated by using field emission scanning electron microscopy and grazing incidence x-ray diffraction, and were discussed in conjunction with the PL data.  
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  Notes Annealing Approved no  
  Call Number RPLAB @ gujma @ Serial 692  
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Author Dauler, Eric; Kerman, Andrew; Robinson, Bryan; Yang, Joel; Voronov, Boris; Goltsman, Gregory; Hamilton, Scott; Berggren, Karl url  doi
openurl 
  Title Photon-number-resolution with sub-30-ps timing using multi-element superconducting nanowire single photon detectors Type Journal Article
  Year 2009 Publication J. Modern Opt. Abbreviated Journal J. Modern Opt.  
  Volume 56 Issue (down) 2 Pages 364-373  
  Keywords PNR SSPD; SNSPD; photon-number-resolution; superconducting nanowire single photon detector; timing jitter; system detection efficiency  
  Abstract A photon-number-resolving detector based on a four-element superconducting nanowire single photon detector is demonstrated to have sub-30-ps resolution in measuring the arrival time of individual photons. This detector can be used to characterize the photon statistics of non-pulsed light sources and to mitigate dead-time effects in high-speed photon counting applications. Furthermore, a 25% system detection efficiency at 1550 nm was demonstrated, making the detector useful for both low-flux source characterization and high-speed photon-counting and quantum communication applications. The design, fabrication and testing of this detector are described, and a comparison between the measured and theoretical performance is presented.  
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  Notes Approved no  
  Call Number RPLAB @ gujma @ Serial 700  
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