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Gershenzon, E. M., Gershenzon, M. E., Gol'tsman, G. N., Semenov, A. D., & Sergeev, A. V. (1982). Nonselective effect of electromagnetic radiation on a superconducting film in the resistive state. JETP Lett., 36(7), 296–299.
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Ozhegov, R. V., Okunev, O. V., Gol’tsman, G. N., Filippenko, L. V., & Koshelets, V. P. (2009). Noise equivalent temperature difference of a superconducting integrated terahertz receiver. J. Commun. Technol. Electron., 54(6), 716–720.
Abstract: The dependence of the noise equivalent temperature difference (NETD) of a superconducting integrated receiver (SIR) on the receiver noise temperature and the inputsignal level has been investigated. An unprecedented NETD of 13±2 mK has been measured at a SIR noise temperature of 200 K, intermediate-frequency bandwidth of 4 GHz, and time constant of 1 s. With a decrease in the input signal, an improvement in the NETD is observed. This effect is explained by a reduction in the influence of the instabilities of the receiver power supply and the amplification circuit that occur when the input signal is decreased.
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Lobanov, Y., Shcherbatenko, M., Shurakov, A., Rodin, A. V., Klimchuk, A., Nadezhdinsky, A. I., et al. (2014). Heterodyne detection at near-infrared wavelengths with a superconducting NbN hot-electron bolometer mixer. Opt. Lett., 39(6), 1429–1432.
Abstract: We report on the development of a highly sensitive optical receiver for heterodyne IR spectroscopy at the communication wavelength of 1.5 μm (200 THz) by use of a superconducting hot-electron bolometer. The results are important for the resolution of narrow spectral molecular lines in the near-IR range for the study of astronomical objects, as well as for quantum optical tomography and fiber-optic sensing. Receiver configuration as well as fiber-to-detector light coupling designs are discussed. Light absorption of the superconducting detectors was enhanced by nano-optical antennas, which were coupled to optical fibers. An intermediate frequency (IF) bandwidth of about 3 GHz was found in agreement with measurements at 300 GHz, and a noise figure of about 25 dB was obtained that was only 10 dB above the quantum limit.
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Klapwijk, T. M., & Semenov, A. V. (2017). Engineering physics of superconducting hot-electron bolometer mixers. IEEE Trans. THz Sci. Technol., 7(6), 627–648.
Abstract: Superconducting hot-electron bolometers are presently the best performing mixing devices for the frequency range beyond 1.2 THz, where good-quality superconductor-insulator-superconductor devices do not exist. Their physical appearance is very simple: an antenna consisting of a normal metal, sometimes a normal-metal-superconductor bilayer, connected to a thin film of a narrow short superconductor with a high resistivity in the normal state. The device is brought into an optimal operating regime by applying a dc current and a certain amount of local-oscillator power. Despite this technological simplicity, its operation has found to be controlled by many different aspects of superconductivity, all occurring simultaneously. A core ingredient is the understanding that there are two sources of resistance in a superconductor: a charge-conversion resistance occurring at a normal-metal-superconductor interface and a resistance due to time-dependent changes of the superconducting phase. The latter is responsible for the actual mixing process in a nonuniform superconducting environment set up by the bias conditions and the geometry. The present understanding indicates that further improvement needs to be found in the use of other materials with a faster energy relaxation rate. Meanwhile, several empirical parameters have become physically meaningful indicators of the devices, which will facilitate the technological developments.
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Finkel, M., Thierschmann, H., Galatro, L., Katan, A. J., Thoen, D. J., de Visser, P. J., et al. (2017). Performance of THz components based on microstrip PECVD SiNx technology. IEEE Trans. THz Sci. Technol., 7(6), 765–771.
Abstract: We present a performance analysis of passive THz components based on Microstrip transmission lines with a 2-μmthin plasma-enhanced chemical vapor deposition grown silicon nitride (PECVD SiNX) dielectric layer. A set of thru-reflect-line calibration structures is used for basic transmission line characterizations. We obtain losses of 9 dB/mm at 300 GHz. Branchline hybrid couplers are realized that exhibit 2.5-dB insertion loss, 1-dB amplitude imbalance, and -26-dB isolation, in agreement with simulations. We use the measured center frequency to determine the dielectric constant of the PECVD SiN x , which yields 5.9. We estimate the wafer-to-wafer variations to be of the order of 1%. Directional couplers are presented which exhibit -12-dB transmission to the coupled port and -26 dB to the isolated port. For transmission lines with 5-μm-thin silicon nitride (SiN x ), we observe losses below 4 dB/mm. The thin SiN x dielectric membrane makes the THz components compatible with scanning probe microscopy cantilevers allowing the application of this technology in on-chip circuits of a THz near-field microscope.
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