| Author |
Title |
Year |
Publication |
Volume |
Pages |
| Huang, Kevin C. Y.; Jun, Young Chul; Seo, Min-Kyo; Brongersma, Mark L. |
Power flow from a dipole emitter near an optical antenna |
2011 |
Optics Express |
19 |
19084-19092 |
| Peruzzo, Alberto; Laing, Anthony; Politi, Alberto; Rudolph, Terry; O'Brien, Jeremy L. |
Multimode quantum interference of photons in multiport integrated devices |
2011 |
Nature Communications |
2 |
6 |
| Baek, Burm; Lita, Adriana E.; Verma, Varun; Nam, Sae Woo |
Superconducting a-WxSi1–x nanowire single-photon detector with saturated internal quantum efficiency from visible to 1850 nm |
2011 |
Applied Physics Letters |
98 |
3 |
| Korneeva, Y.; Florya, I.; Semenov, A.; Korneev, A.; Goltsman, G. |
New generation of nanowire NbN superconducting single-photon detector for mid-infrared |
2011 |
IEEE Trans. Appl. Supercond. |
21 |
323-326 |
| Ozhegov, R. V.; Gorshkov, K. N.; Gol'tsman, G. N.; Kinev, N. V.; Koshelets, V. P. |
The stability of a terahertz receiver based on a superconducting integrated receiver |
2011 |
Supercond. Sci. Technol. |
24 |
035003 |
| Tretyakov, Ivan; Ryabchun, Sergey; Finkel, Matvey; Maslennikov, Sergey; Maslennikova, Anna; Kaurova, Natalia; Lobastova, Anastasia; Voronov, Boris; Gol'tsman, Gregory |
Ultrawide noise bandwidth of NbN hot-electron bolometer mixers with in situ gold contacts |
2011 |
IEEE Trans. Appl. Supercond. |
21 |
620-623 |
| Lobanov, Y.; Tong, E.; Blundell, R.; Hedden, A.; Voronov, B.; Gol'tsman, G. |
Large-signal frequency response of an HEB mixer: from 300 MHz to terahertz |
2011 |
IEEE Trans. Appl. Supercond. |
21 |
628-631 |
| Lobanov, Y.V.; Tong, C.-Y.E.; Hedden, A.S.; Blundell, R.; Voronov, B.M.; Gol'tsman, G.N. |
Direct measurement of the gain and noise bandwidths of HEB mixers |
2011 |
IEEE Trans. Appl. Supercond. |
21 |
645-648 |
| Kawakami, A; Saito, S.; Hyodo, M. |
Fabrication of nano-antennas for superconducting Infrared detectors |
2011 |
IEEE Trans. Appl. Supercond. |
21 |
632-635 |
| Galeazzi, Massimiliano |
Fundamental noise processes in TES devices |
2011 |
IEEE Trans. Appl. Supercond. |
21 |
267-271 |
