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Author Title Year Publication Volume Pages
Aksaev, E. E.; Gershenzon, E.M.; Gol'tsman, G. N.; Mirskij, G. I.; Semenov, A. D. Submillimetric spectrometer-relaxometer based on backward-wave tubes with picosecond time resolution 1991 Pribory i Tekhnika Eksperimenta 34 125-131
Gershenzon, E. M.; Gol'tsman, G. N.; Ptitsina, N. G. Population and lifetime of excited states of shallow impurities in Ge 1979 Sov. Phys. JETP 49 355-362
Gershenzon, E. M.; Gol'tsman, G. N.; Ptitsina, N. G. Submillimeter spectroscopy of semiconductors 1973 Sov. Phys. JETP 37 299-304
Gershenzon, E. M.; Gol'tsman, G. N. Transitions of electrons between excited states of donors in germanium 1971 JETP Lett. 14 63-65
Delacour, C.; Claudon, J.; Poizat, J.-Ph.; Pannetier, B.; Bouchiat, V.; de Lamaestre, R. Espiau; Villegier, J.-C.; Tarkhov, M.; Korneev, A.; Voronov, B.; Gol'tsman, G. Superconducting single photon detectors made by local oxidation with an atomic force microscope 2007 Appl. Phys. Lett. 90 191116 (1 t0 3)
Il'in, K. S.; Lindgren, M.; Currie, M. A.; Semenov, D.; Gol'tsman, G. N.; Sobolewski, Roman; Cherednichenko, S. I.; Gershenzon, E. M. Picosecond hot-electron energy relaxation in NbN superconducting photodetectors 2000 Appl. Phys. Lett. 76 2752-2754
Yagoubov, P.; Kroug, M.; Merkel, H.; Kollberg, E.; Gol'tsman, G.; Svechnikov, S.; Gershenzon, E. Noise temperature and local oscillator power requirement of NbN phonon-cooled hot electron bolometric mixers at terahertz frequencies 1998 Appl. Phys. Lett. 73 2814-2816
Beck, M.; Klammer, M.; Lang, S.; Leiderer, P.; Kabanov, V. V.; Gol'tsman, G. N.; Demsar, J. Energy-gap dynamics of superconducting NbN thin films studied by time-resolved terahertz spectroscopy 2011 Phys. Rev. Lett. 107 4
Baselmans, J. J. A.; Baryshev, A.; Reker, S. F.; Hajenius, M.; Gao, J. R.; Klapwijk, T. M.; Vahtomin, Yu.; Maslennikov, S.; Antipov, S.; Voronov, B.; Gol'tsman, G. Direct detection effect in small volume hot electron bolometer mixers 2005 Appl. Phys. Lett. 86 163503 (1 to 3)
Zhang, J.; Boiadjieva, N.; Chulkova, G.; Deslandes, H.; Gol'tsman, G. N.; Korneev, A.; Kouminov, P.; Leibowitz, M.; Lo, W.; Malinsky, R.; Okunev, O.; Pearlman, A.; Slysz, W.; Smirnov, K.; Tsao, C.; Verevkin, A.; Voronov, B.; Wilsher, K.; Sobolewski, R. Noninvasive CMOS circuit testing with NbN superconducting single-photon detectors 2003 Electron. Lett. 39 1086-1088