Author |
Title |
Year |
Publication |
Volume |
Pages |
Korneev, A.; Divochiy, A.; Marsili, F.; Bitauld, D.; Fiore, A.; Seleznev, V.; Kaurova, N.; Tarkhov, M.; Minaeva, O.; Chulkova, G.; Smirnov, K.; Gaggero, A.; Leoni, R.; Mattioli, F.; Lagoudakis, K.; Benkhaoul, M.; Levy, F.; Goltsman, G. |
Superconducting photon number resolving counter for near infrared applications |
2008 |
Proc. SPIE |
7138 |
713828 (1 to 5) |
Marsili, Francesco; Bitauld, David; Fiore, Andrea; Gaggero, Alessandro; Mattioli, Francesco; Leoni, Roberto; Divochiy, Aleksander; Gol'tsman, Gregory |
Photon-number-resolution at telecom wavelength with superconducting nanowires |
2010 |
IntechOpen |
|
|
Minaeva, O.; Fraine, A.; Korneev, A.; Divochiy, A.; Goltsman, G.; Sergienko, A. |
High resolution optical time-domain reflectometry using superconducting single-photon detectors |
2012 |
Frontiers in Opt. 2012/Laser Sci. XXVIII |
|
Fw3a.39 |
Takemoto, K.; Nambu, Y.; Miyazawa, T.; Sakuma, Y.; Yamamoto, T.; Yorozu, S.; Arakawa, Y. |
Quantum key distribution over 120 km using ultrahigh purity single-photon source and superconducting single-photon detectors |
2015 |
Sci. Rep. |
5 |
14383 |
Korneev, A.; Divochiy, A.; Tarkhov, M.; Minaeva, O.; Seleznev, V.; Kaurova, N.; Voronov, B.; Okunev, O.; Chulkova, G.; Milostnaya, I.; Smirnov, K.; Gol’tsman, G. |
Superconducting NbN-nanowire single-photon detectors capable of photon number resolving |
2008 |
Supercond. News Forum |
|
|
Ozhegov, R.; Elezov, M.; Kurochkin, Y.; Kurochkin, V.; Divochiy, A.; Kovalyuk, V.; Vachtomin, Y.; Smirnov, K.; Goltsman, G. |
Quantum key distribution over 300 |
2014 |
Proc. SPIE |
9440 |
1F (1 to 9) |
Smirnov, K. V.; Vakhtomin, Yu. B.; Divochiy, A. V.; Ozhegov, R. V.; Pentin, I. V.; Slivinskaya, E. V.; Tarkhov, M. A.; Gol’tsman, G. N. |
Single-photon detectors for the visible and infrared parts of the spectrum based on NbN nanostructures |
2009 |
Proc. Progress In Electromagnetics Research Symp. |
|
863-864 |
Manus, M. K. Mc; Kash, J. A.; Steen, S. E.; Polonsky, S.; Tsang, J.C.; Knebel, D. R.; Huott, W. |
PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis |
2000 |
Microelectronics Reliability |
40 |
1353-1358 |
Stellari, Franco; Song, Peilin |
Testing of ultra low voltage CMOS microprocessors using the superconducting single-photon detector (SSPD) |
2005 |
Proc. 12th IPFA |
|
2 |
Driessen, E. F. C.; Braakman, F. R.; Reiger, E. M.; Dorenbos, S. N.; Zwiller, V.; de Dood, M. J. A. |
Impedance model for the polarization-dependent optical absorption of superconducting single-photon detectors |
2009 |
Eur. Phys. J. Appl. Phys. |
47 |
10701 |