Records |
Author |
Yagoubov, P.; Gol'tsman, G.; Voronov, B.; Svechnikov, S.; Cherednichenko, S.; Gershenzon, E.; Belitsky, V.; Ekström, H.; Semenov, A.; Gousev, Yu.; Renk, K. |
Title |
Quasioptical phonon-cooled NbN hot-electron bolometer mixer at THz frequencies |
Type |
Conference Article |
Year |
1996 |
Publication |
Proc. 7th Int. Symp. Space Terahertz Technol. |
Abbreviated Journal |
Proc. 7th Int. Symp. Space Terahertz Technol. |
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Issue |
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Pages |
303-317 |
Keywords |
NbN HEB mixers |
Abstract |
In our experiments we tested phonon-cooled hot-electron bolometer (HEB) quasioptical mixer based on spiral antenna designed for 0.5-1.2 THz frequency band and fabricated on sapphire, Si-coated sapphire and high resistivity silicon substrates. HEB devices were produced from thin superconducting NbN film 3.5-6 nm thick with the critical temperature of about 11-12 K. For these devices we achieved the receiver noise temperature T R (DSB) = 3000 K in the 500-700 GHz frequency range and an IF bandwidth of 3-4 GHz. Prelimanary measurements at frequencies 1-1.2 THz resulted the receiver noise temperature about 9000 K (DSB). |
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1614 |
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Gerecht, E.; Musante, C. F.; Wang, Z.; Yngvesson, K. S.; Mueller, E. R.; Waldman, J.; Gol'tsman, G. N.; Voronov, B. M.; Cherednichenco, S. I.; Svechnikov, S. I.; Yagoubov, P. A.; Gershenzon, E. M. |
Title |
Optimization of hot eleciron bolometer mixing efficiency in NbN at 119 micrometer wavelength |
Type |
Conference Article |
Year |
1996 |
Publication |
Proc. 7th Int. Symp. Space Terahertz Technol. |
Abbreviated Journal |
Proc. 7th Int. Symp. Space Terahertz Technol. |
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Pages |
584-600 |
Keywords |
NbN HEB mixers |
Abstract |
We describe an investigation of a NbN HEB mixer for 2.5 THz. An intrinsic conversion loss of 23 dB has been measured with a two-laser measurement technique. The conversion loss was limited by the LO power available and is expected to decrease to 10 dB or less when sufficient LO power is available. For this initial experiment we used a prototype device which is directly coupled to the laser beams. We present results for a back-short technique that improves the optical coupling to the device and describe our progress for an antenna-coupled device with a smaller dimension. Based on our measured data for conversion loss and device output noise level, we predict that NbN HEB mixers will be capable of achieving DSB receiver noise temperatures of ten times the quantum noise limit in the THz range. |
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1616 |
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Gousev, Y. P.; Gol'tsman, G. N.; Karasik, B. S.; Gershenzon, E. M.; Semenov, A. D.; Barowski, H. S.; Nebosis, R. S.; Renk, K. F. |
Title |
Quasioptical superconducting hot electron bolometer for submillmeter waves |
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Journal Article |
Year |
1996 |
Publication |
Int. J. of Infrared and Millimeter Waves |
Abbreviated Journal |
Int. J. of Infrared and Millimeter Waves |
Volume |
17 |
Issue |
2 |
Pages |
317-331 |
Keywords |
NbN HEB |
Abstract |
We report on a superconducting hot electron bolometer coupled to radiation via a broadband antenna. The bolometer, a structured NbN film, was patterned on a thin dielectric membrane between terminals of a gold slotline antenna. We investigated the response to submillimeter radiation (wave-lengths ∼ 0.1 mm to 0.7 mm) in the fundamental Gaussian mode. We found that the directivity of the antenna was constant within a factor of 2.5 through the whole experimental range. The noise equivalent power of the bolometer at 119 µm was ∼ 3 · 10−13 W/Hz1/2; a time constant of ∼ 160 ps was estimated. |
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0195-9271 |
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1618 |
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Il'in, K. S.; Karasik, B. S.; Ptitsina, N. G.; Sergeev, A. V.; Gol'tsman, G. N.; Gershenzon, E. M.; Pechen, E. V.; Krasnosvobodtsev, S. I. |
Title |
Electron-phonon-impurity interference in thin NbC films: electron inelastic scattering time and corrections to resistivity |
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Conference Article |
Year |
1996 |
Publication |
Czech. J. Phys. |
Abbreviated Journal |
Czech. J. Phys. |
Volume |
46 |
Issue |
S2 |
Pages |
857-858 |
Keywords |
NbC films |
Abstract |
Complex study of transport properties of impure NbC films with the electron mean free pathl=0.6–13 nm show the crucial role of the electron-phonon-impurity interference (EPII). In the temperature range 20–70 K we found the interference correction to resistivity proportional to T2 and to the residual resistivity of the film. Using the comprehensive theory of EPII, we determine the electron coupling with transverse phonons and calculate the electron inelastic scattering time. Direct measurements of the inelastic electron scattering time using a response to a high-frequency amplitude modulated cw radiation agree well with the theory. |
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0011-4626 |
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1617 |
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Currie, N. C.; Demma, F. J.; Ferris Jr., D. D.; Kwasowsky, B. R.; McMillan, R. W.; Wicks, M. C. |
Title |
Infrared and millimeter-wave sensors for military special operations and law enforcement applications |
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Journal Article |
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1996 |
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Int. J. Infrared and Millimeter Waves |
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17 |
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7 |
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1117-1138 |
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HgCdTe |
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0195-9271 |
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466 |
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Nebosis, R. S.; Semenov, A. D.; Gousev, Yu. P.; Renk, K. F. |
Title |
Rigorous analysis of a superconducting hot-electron bolometer mixer: theory and comparision with experiment |
Type |
Conference Article |
Year |
1996 |
Publication |
Proc. 7th Int. Symp. Space Terahertz Technol. |
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Pages |
601-613 |
Keywords |
HEB mixer, model, conversion gain, noise temperature, impedance, 2.5 THz |
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Charlottesville, Virginia, USA |
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605 |
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Karasik, B. S.; Il'in, K. S.; Pechen, E. V.; Krasnosvobodtsev, S. I. |
Title |
Diffusion cooling mechanism in a hot-electron NbC microbolometer mixer |
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Journal Article |
Year |
1996 |
Publication |
Applied Physics Letters |
Abbreviated Journal |
Appl. Phys. Lett. |
Volume |
68 |
Issue |
16 |
Pages |
2285-2287 |
Keywords |
HEB mixer, diffusion cooling channel, diffusion channel |
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0003-6951 |
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262 |
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Karasik, B. S.; Elantiev, A. I. |
Title |
Noise temperature limit of a superconducting hot-electron bolometer mixer |
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Journal Article |
Year |
1996 |
Publication |
Applied Physics Letters |
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Appl. Phys. Lett. |
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68 |
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6 |
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853-855 |
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HEB mixer noise temperature, Johnson noise, thermal fluctuation noise, noise bandwidth |
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0003-6951 |
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260 |
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ГОСТ Р 15.011-96. Патентные исследования. Содержание и порядок проведения |
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Book Whole |
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1996 |
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gost, patents, detproj |
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865 |
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ГОСТ Р 50995.3.1-96. Технологическое обеспечение создания продукции. Технологическая подготовка производства |
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1996 |
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gost, detproj |
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874 |
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