Karasik, B. S., & Elantiev, A. I. (1995). Analysis of the noise performance of a hot-electron superconducting bolometer mixer. In Proc. 6th Int. Symp. Space Terahertz Technol. (pp. 229–246). Pasadena, Ca.
Abstract: A theoretical analysis for the noise temperature of hot–electron superconducting mixer has been presented. Thecontributions of both Johnson noise and electron temperature fluctuations have been evaluated. A set of criteriaensuring low noise performance of the mixer has been stated and a simple analytic expression for the noisetemperature of the mixer device has been suggested. It has been shown that an improvement of the mixer sensitivitydoes not necessarily follow by a decrease of the bandwidth. An SSB noise temperature limit due to the intrinsic noisemechanisms has been estimated to be as low as 40–90 K for a mixer device made from Nb or NbN thin film.Furthermore, the conversion gain bandwidth can be as wide as is allowed by the intrinsic electron temperaturerelaxation time if an appropriate choice of the mixer resistance has been made. The intrinsic mixer noise bandwidthis of 3 GHz for Nb device and of 5 GHz for NbN device. An additional improvement of the theory has been madewhen a distinction between the impedance measured at high intermediate frequency (larger than the mixerbandwidth) and the mixer ohmic resistance has been taken into account.Recently obtained experimental data on Nb and NbNbolometer mixer devices are viewed in connection with thetheoretical predictions.The noise temperature limit has also been specified for the mixer device where an outdiffusion coolingmechanism rather than the electron–phonon energy relaxation determines the mixer bandwidth. A consideration ofthe noise performance of a bolometer mixer made from YBaCuO film utilizing a hot–electron effect has been done.
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Ekström, H., Karasik, B., Kollberg, E., & Yngvesson, K. S. (1994). Investigation of a superconducting hot electron mixer. In Proc. 5th Int. Symp. Space Terahertz Technol. (pp. 169–188).
Abstract: Mixing at 20 GHz in niobium superconducting thin film strips in the resistive state is studied. Experiments give evidence that electron-heating is the main cause of the non linear phenomena. The requirements on the mode of operation and on the film parameters for small conversion loss and the possibility of conversion gain are discussed. Measurements indicate a minimum intrinsic conversion loss around 1 dB with a sharp drop for the lowest voltage bias-points, and a DSB mixer noise temperature between 100 and 450 K at 20 GHz. The device output noise temperature at the mixer operating point can be as low as 30-50 K. A simple theory is presented, which is based on the assumption that the small signal resistance is linearly dependent on power. This type of mixer is considered very promising for use in low-noise heterodyne receivers at THz frequencies.
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Burke, P. J., Schoelkopf, R. J., Prober, D. E., Skalare, A., Karasik, B. S., Gaidis, M. C., et al. (1999). Mixing and noise in diffusion and phonon cooled superconducting hot-electron bolometers. J. Appl. Phys., 85(3), 1644–1653.
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Gershenzon, E. M., Gol'tsman, G. N., Karasik, B. S., Lugovaya, G. Y., Serebryakova, N. A., & Chinkova, E. V. (1992). Infrared radiation detectors on the base of electron heating in resistive state films from traditional superconducing materials. Sverkhprovodimost': Fizika, Khimiya, Tekhnika, 5(6), 1129–1140.
Abstract: Characteristics of infrared radiation detectors based on electron heating in thin superconducting films transformed at T ≤ Tc to a resistive state by transport current and, if necessary, by magnetic field are investigated. A comparison is made of the characteristics of the detectors fabricated of different materials: aluminium, niobium, Mo0.5Re0.5. Some devices with different topology of the reception area are considered. Electron heating detectors are comparable by their sensitivity with superconducting bolometers, but differ in a high fast-response.
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Elant'ev, A. I., & Karasik, B. S. (1989). Effect of high-frequency current on Nb superconductive film in resistive state. Sov. J. Low Temp. Phys., 15(7), 379–383.
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