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Author Stevens, M.; Hadfield, R.; Schwall, R.; Nam, S.W.; Mirin, R.; Gupta, J. doi  openurl
  Title Fast lifetime measurements of infrared emitters using a low-jitter superconduct- ing single-photon detector Type Journal Article
  Year 2006 Publication Applied Physics Letters Abbreviated Journal Appl. Phys. Lett.  
  Volume 89 Issue Pages 031109  
  Keywords (down) SSPD, jitter, QD, QW  
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  Area Expedition Conference  
  Notes Approved no  
  Call Number RPLAB @ akorneev @ Serial 611  
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Author Stevens, M.; Hadfeld, R.; Schwall, R.; Nam, S.W.; and Mirin, R. openurl 
  Title Quantum dot single photon sources studied with superconducting single photon detectors Type Journal Article
  Year 2006 Publication IEEE J. Sel. Topics Quantum Electron. Abbreviated Journal  
  Volume 12 Issue 6 Pages 1255-1267  
  Keywords (down) SSPD, jitter, QD, QW  
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  Notes Approved no  
  Call Number RPLAB @ akorneev @ Serial 612  
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Author Manus, M. K. Mc; Kash, J. A.; Steen, S. E.; Polonsky, S.; Tsang, J.C.; Knebel, D. R.; Huott, W. doi  openurl
  Title PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis Type Journal Article
  Year 2000 Publication Microelectronics Reliability Abbreviated Journal Microelectronics Reliability  
  Volume 40 Issue Pages 1353-1358  
  Keywords (down) SSPD, CMOS testing  
  Abstract Normal operation of complementary metal-oxide semiconductor (CMOS) devices entails the emission of picosecond pulses of light, which can be used to diagnose circuit problems. The pulses that are observed from submicron sized field effect transistors (FETs) are synchronous with logic state switching. Picosecond Imaging Circuit Analysis (PICA), a new optical imaging technique combining imaging with timing, spatially resolves individual devices at the 0.5 micron level and switching events on a 10 picosecond timescale. PICA is used here for the diagnostics of failures on two VLSI microprocessors.  
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  Notes Approved no  
  Call Number Serial 1054  
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Author Stellari, Franco; Song, Peilin doi  isbn
openurl 
  Title Testing of ultra low voltage CMOS microprocessors using the superconducting single-photon detector (SSPD) Type Conference Article
  Year 2005 Publication Proc. 12th IPFA Abbreviated Journal Proc. 12th IPFA  
  Volume Issue Pages 2  
  Keywords (down) SSPD, CMOS testing  
  Abstract In F. Stellari and P. Song (2004) the authors have shown a comparison among different detectors used for diagnosing integrated circuits (ICs) by means of the PICA method. In their experiments they used two versions of the SSPD detector (p-SSPD is a prototype version, while c-SSPD is the first commercially available generation of the detector as presented in W. K. Lo et al. (2002), as well as the imaging detector (S-25 photo-multiplier tube (PMT) as discussed in W. G. McMullan (1987)) used in the conventional PICA technique. A microprocessor chip fabricated in a 0.13 μm 1.2 V technology is used to show that c-SSPD provides a significant reduction in acquisition time for the collection of optical waveforms from chips running at very low. In this paper, the authors summarize the main results.  
  Address  
  Corporate Author Thesis  
  Publisher IEEE Place of Publication Editor  
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  ISSN ISBN 0-7803-9301-5 Medium  
  Area Expedition Conference  
  Notes Approved no  
  Call Number Serial 1055  
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Author Marsili, F.; Verma, V. B.; Stern, J. A.; Harrington, S.; Lita, A. E.; Gerrits, T.; Vayshenker, I.; Baek, B.; Shaw, M. D.; Mirin, R. P.; Nam, S. W. doi  openurl
  Title Detecting single infrared photons with 93% system efficiency Type Journal Article
  Year 2013 Publication Nat. Photon. Abbreviated Journal  
  Volume 7 Issue 3 Pages 210-214  
  Keywords (down) SSPD quantum efficiency  
  Abstract Single-photon detectors1 at near-infrared wavelengths with high system detection efficiency (>90%), low dark count rate (<1 c.p.s.), low timing jitter (<100 ps) and short reset time (<100 ns) would enable landmark experiments in a variety of fields2, 3, 4, 5, 6. Although some of the existing approaches to single-photon detection fulfil one or two of the above specifications1, to date, no detector has met all of the specifications simultaneously. Here, we report on a fibre-coupled single-photon detection system that uses superconducting nanowire single-photon detectors7 and closely approaches the ideal performance of single-photon detectors. Our detector system has a system detection efficiency (including optical coupling losses) greater than 90% in the wavelength range λ = 1,520–1,610 nm, with a device dark count rate (measured with the device shielded from any background radiation) of ~1 c.p.s., timing jitter of ~150 ps full-width at half-maximum (FWHM) and reset time of 40 ns.  
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  Area Expedition Conference  
  Notes Approved no  
  Call Number Serial 1056  
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