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Author |
Alexandre Karpov; David Miller; Rice, Frank R.; Stern, Jeffrey A.; Bruce Bumble; LeDuc, Henry G.; Jonas Zmuidzinas |
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Title |
Low-noise SIS mixer for far-infrared radio astronomy |
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Conference Article |
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Year |
2004 |
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Proc. SPIE |
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5498 |
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616-621 |
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Glasgow, Scotland, UK |
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RPLAB @ s @ nt_SIS_550at1p2THz |
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353 |
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Author |
Каурова, Н. С.; Финкель, М. И.; Масленников, С. Н.; Вахтомин, Ю. Б.; Антипов, С. В.; Смирнов, К. В.; Воронов, Б. М.; Гольцман, Г. Н.; Ильин, К. С. |
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Title |
Смеситель субмиллиметрового диапазона длин волн на основе тонкой пленки YBa2Cu3O7-x |
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Conference Article |
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Year |
2004 |
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1-я международная конференция Фундаментальные проблемы высокотемпературной сверхпроводимости |
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291 |
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Москва-Звенигород |
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Москва-Звенигород |
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russian |
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RPLAB @ s @ htsmix_zvenigorod_2004_rus |
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356 |
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Author |
Shytov, A. V.; Levitov, L. S.; Beenakker, C. W. J. |
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Title |
Electromechanical noise in a diffusive conductor |
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Journal Article |
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Year |
2002 |
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Phys. Rev. Lett. |
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Phys. Rev. Lett. |
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88 |
Issue |
22 |
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Electrons moving in a conductor can transfer momentum to the lattice via collisions with impurities and boundaries, giving rise to a fluctuating mechanical stress tensor. The root-mean-squared momentum transfer per scattering event in a disordered metal (of dimension L greater than the mean free path l and screening length xi) is found to be reduced below the Fermi momentum by a factor of order l/L for shear fluctuations and (xi/L)^2 for pressure fluctuations. The excitation of an elastic bending mode by the shear fluctuations is estimated to fall within current experimental sensitivity for a nanomechanical oscillator. |
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0031-9007 |
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433 |
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Author |
Henry, Richard C. |
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Title |
Diffuse background radiation |
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Journal Article |
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1999 |
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Astrophys. J. |
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516 |
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2 |
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L49-L52 |
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0004637X |
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434 |
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Author |
Dorenbos, S. N.; Reiger, E. M.; Perinetti, U.; Zwiller, V.; Zijlstra, T.; Klapwijk, T. M. |
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Title |
Low noise superconducting single photon detectors on silicon |
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Journal Article |
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Year |
2008 |
Publication |
Applied Physics Letters |
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Appl. Phys. Lett. |
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Volume |
93 |
Issue |
13 |
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131101 |
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0003-6951 |
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no |
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RPLAB @ s @ |
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436 |
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