| Author |
Title |
Year |
Publication |
Volume |
Pages |
| Manus, M. K. Mc; Kash, J. A.; Steen, S. E.; Polonsky, S.; Tsang, J.C.; Knebel, D. R.; Huott, W. |
PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis |
2000 |
Microelectronics Reliability |
40 |
1353-1358 |
| Stellari, Franco; Song, Peilin |
Testing of ultra low voltage CMOS microprocessors using the superconducting single-photon detector (SSPD) |
2005 |
Proc. 12th IPFA |
|
2 |
| Stevens, M.; Hadfield, R.; Schwall, R.; Nam, S.W.; Mirin, R.; Gupta, J. |
Fast lifetime measurements of infrared emitters using a low-jitter superconduct- ing single-photon detector |
2006 |
Applied Physics Letters |
89 |
031109 |
| Stevens, M.; Hadfeld, R.; Schwall, R.; Nam, S.W.; and Mirin, R. |
Quantum dot single photon sources studied with superconducting single photon detectors |
2006 |
IEEE J. Sel. Topics Quantum Electron. |
12 |
1255-1267 |
| Yang, J. K. W.; Kerman, A. J.; Dauler, E. A.; Anant, V.; Rosfjord, K. M.; Berggren, K. K. |
Modeling the electrical and thermal response of superconducting nanowire single-photon detectors |
2007 |
IEEE Trans. Appl. Supercond. |
17 |
581 - 585 |
