Records |
Author |
Karasik, B. S.; Elantiev, A. I. |
Title |
Noise temperature limit of a superconducting hot-electron bolometer mixer |
Type |
Journal Article |
Year |
1996 |
Publication |
Applied Physics Letters |
Abbreviated Journal |
Appl. Phys. Lett. |
Volume |
68 |
Issue |
6 |
Pages |
853-855 |
Keywords ![sorted by Keywords field, ascending order (up)](img/sort_asc.gif) |
HEB mixer noise temperature, Johnson noise, thermal fluctuation noise, noise bandwidth |
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0003-6951 |
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260 |
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Author |
Shurakov, Alexander; Tong, Edward; Blundell, Raymond; Gol'tsman, Gregory |
Title |
Microwave stabilization of HEB mixer by a microchip controller |
Type |
Conference Article |
Year |
2012 |
Publication |
IEEE MTT-S international microwave symposium digest |
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Volume |
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Issue |
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Pages |
1-3 |
Keywords ![sorted by Keywords field, ascending order (up)](img/sort_asc.gif) |
HEB mixer stability, microwave injection, Allan variance, Allan time |
Abstract |
The stability of a Hot Electron Bolometer (HEB) mixer can be improved by the use of microwave injection. In this article we report a refinement of this approach. We introduce a microchip controller to facilitate the implementation of the stabilization scheme, and demonstrate that the feedback loop effectively suppresses drifts in the HEB bias current, leading to an improvement in the receiver stability. The measured Allan time of the mixer's IF output power is increased to > 10 s. |
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Montreal, QC, Canada |
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857 |
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Author |
Semenov, A. D.; Hübers, H.-W.; Schubert, J.; Gol'tsman, G. N.; Elantiev, A. I.; Voronov, B. M.; Gershenzon, E. M. |
Title |
Design and performance of the lattice-cooled hot-electron terahertz mixer |
Type |
Journal Article |
Year |
2000 |
Publication |
J. Appl. Phys. |
Abbreviated Journal |
J. Appl. Phys. |
Volume |
88 |
Issue |
11 |
Pages |
6758-6767 |
Keywords ![sorted by Keywords field, ascending order (up)](img/sort_asc.gif) |
HEB mixer, charge imbalance, HF current distribution |
Abstract |
We present the measurements and the theoreticalmodel of the frequency-dependent noise temperature of a superconductor lattice-cooled hot-electron bolometer mixer in the terahertz frequency range. The increase of the noise temperature with frequency is a cumulative effect of the nonuniform distribution of the high-frequency current in the bolometer and the charge imbalance, which occurs at the edges of the normal domain and at the contacts with normal metal. We show that under optimal operation the fluctuation sensitivity of the mixer is determined by thermodynamic fluctuations of the noise power, whereas at small biases there appears additional noise, which is probably due to the flux flow. We propose the prescription of how to minimize the influence of the current distribution on the mixer performance. |
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0021-8979 |
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306 |
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Shcherbatenko, M.; Tretyakov, I.; Lobanov, Yu.; Maslennikov, S. N.; Kaurova, N.; Finkel, M.; Voronov, B.; Goltsman, G.; Klapwijk, T. M. |
Title |
Nonequilibrium interpretation of DC properties of NbN superconducting hot electron bolometers |
Type |
Journal Article |
Year |
2016 |
Publication |
Appl. Phys. Lett. |
Abbreviated Journal |
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Volume |
109 |
Issue |
13 |
Pages |
132602 |
Keywords ![sorted by Keywords field, ascending order (up)](img/sort_asc.gif) |
HEB mixer, contacts |
Abstract |
We present a physically consistent interpretation of the dc electrical properties of niobiumnitride (NbN)-based superconducting hot-electron bolometer mixers, using concepts of nonequilibrium superconductivity. Through this, we clarify what physical information can be extracted from the resistive transition and the dc current-voltage characteristics, measured at suitably chosen temperatures, and relevant for device characterization and optimization. We point out that the intrinsic spatial variation of the electronic properties of disordered superconductors, such as NbN, leads to a variation from device to device. |
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Serial |
1107 |
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Author |
Karasik, B. S.; Il'in, K. S.; Pechen, E. V.; Krasnosvobodtsev, S. I. |
Title |
Diffusion cooling mechanism in a hot-electron NbC microbolometer mixer |
Type |
Journal Article |
Year |
1996 |
Publication |
Applied Physics Letters |
Abbreviated Journal |
Appl. Phys. Lett. |
Volume |
68 |
Issue |
16 |
Pages |
2285-2287 |
Keywords ![sorted by Keywords field, ascending order (up)](img/sort_asc.gif) |
HEB mixer, diffusion cooling channel, diffusion channel |
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0003-6951 |
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no |
Call Number |
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Serial |
262 |
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