|
Author |
Title |
Year |
Publication |
Volume |
Pages |
Links |
|
Manus, M. K. Mc; Kash, J. A.; Steen, S. E.; Polonsky, S.; Tsang, J.C.; Knebel, D. R.; Huott, W. |
PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis |
2000 |
Microelectronics Reliability |
40 |
1353-1358 |
|
|
Hoevers, H. F. C.; Bento, A. C.; Bruijn, M. P.; Gottardi, L.; Korevaar, M. A. N.; Mels, W. A.; de Korte, P. A. J. |
Thermal fluctuation noise in a voltage biased superconducting transition edge thermometer |
2000 |
Applied Physics Letters |
77 |
4421-4424 |
|
|
Nagatsuma, T.; Hirata, A.; Royter, Y.; Shinagawa, M.; Furuta, T.; Ishibashi, T.; Ito, H. |
A 120-GHz integrated photonic transmitter |
2000 |
Proc. International topical meeting on microwave photonics (MWP 2000) |
|
225 - 228 |
|
|
Cherednichenko, S.; Rönnung, F.; Gol'tsman, G.; Kollberg, E.; Winkler, D. |
YBa2Cu3O7−δ hot-electron bolometer mixer |
2000 |
Phys. C: Supercond. |
341-348 |
2653-2654 |
|
|
Cherednichenko, S.; Rönnung, F.; Gol’tsman, G.; Kollberg, E.; Winkler, D. |
YBa2Cu3O7-δ hot-electron bolometer mixer at 0.6 THz |
2000 |
Proc. 11th Int. Symp. Space Terahertz Technol. |
|
517-522 |
|