| Author |
Title |
Year |
Publication |
Volume |
Pages |
| Steudle, Gesine A.; Schietinger, Stefan; Höckel, David; Dorenbos, Sander N.; Zadeh, Iman E.; Zwiller, Valery; Benson, Oliver |
Measuring the quantum nature of light with a single source and a single detector |
2012 |
Phys. Rev. A |
86 |
053814 |
| Manus, M. K. Mc; Kash, J. A.; Steen, S. E.; Polonsky, S.; Tsang, J.C.; Knebel, D. R.; Huott, W. |
PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis |
2000 |
Microelectronics Reliability |
40 |
1353-1358 |
| Stellari, Franco; Song, Peilin |
Testing of ultra low voltage CMOS microprocessors using the superconducting single-photon detector (SSPD) |
2005 |
Proc. 12th IPFA |
|
2 |
| Tretyakov, I.; Shurakov, A.; Perepelitsa, A.; Kaurova, N.; Svyatodukh, S.; Zilberley, T.; Ryabchun, S.; Smirnov, M.; Ovchinnikov, O.; Goltsman, G. |
Silicon room temperature IR detectors coated with Ag2S quantum dots |
2019 |
Proc. IWQO |
|
369-371 |
| Bell, Matthew; Sergeev, Andrei; Goltsman, Gregory; Bird, Jonathan; Verevkin, Aleksandr |
Transition-edge sensors based on superconducting nanowires |
2006 |
Proc. APS March Meeting |
|
B38.00001 |
