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Hajenius, M., Barends, R., Gao, J. R., Klapwijk, T. M., Baselmans, J. J. A., Baryshev, A., et al. (2005). Local resistivity and the current-voltage characteristics of hot electron bolometer mixers. IEEE Trans. Appl. Supercond., 15(2), 495–498.
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Klapwijk, T. M., Barends, R., Gao, J. R., Hajenius, M., & Baselmans, J. J. A. (2004). Improved superconducting hot-electron bolometer devices for the THz range. In Proc. SPIE (Vol. 5498, pp. 129–139).
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Ynvesson, K. S., & Kollberg, E. L. (1999). Optimum receiver noise temperature for NbN HEB mixers according to standard model. In Proc. 10th Int. Symp. Space Terahertz Technol. (pp. 566–582).
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Karasik, B. S., & Elantiev, A. I. (1996). Noise temperature limit of a superconducting hot-electron bolometer mixer. Appl. Phys. Lett., 68(6), 853–855.
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Khosropanah, P., Merkel, H., Yngvesson, S., Adam, A., Cherednichenko, S., & Kollberg, E. (2000). A distributed device model for phonon-cooled HEB mixers predicting IV characteristics, gain, noise and IF bandwidth. In Proc. 11th Int. Symp. Space Terahertz Technol. (pp. 474–488). University of Michigan, Ann Arbor, MI USA.
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Barends, R., Hajenius, M., Gao, J. R., & Klapwijk, T. M. (2005). Current-induced vortex unbinding in bolometer mixers. Appl. Phys. Lett., 87, 263506 (1 to 3).
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Shurakov, A., Tong, E., Blundell, R., & Gol'tsman, G. (2012). Microwave stabilization of HEB mixer by a microchip controller. In IEEE MTT-S international microwave symposium digest (pp. 1–3).
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Pütz, P., Honingh, C. E., Jacobs, K., Justen, M., Schultz, M., & Stutzki, J. (2012). Terahertz hot electron bolometer waveguide mixers for GREAT. A&A, 542, L2.
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Semenov, A. D., Hübers, H. - W., Schubert, J., Gol'tsman, G. N., Elantiev, A. I., Voronov, B. M., et al. (2000). Design and performance of the lattice-cooled hot-electron terahertz mixer. J. Appl. Phys., 88(11), 6758–6767.
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Shcherbatenko, M., Tretyakov, I., Lobanov, Y., Maslennikov, S. N., Kaurova, N., Finkel, M., et al. (2016). Nonequilibrium interpretation of DC properties of NbN superconducting hot electron bolometers. Appl. Phys. Lett., 109(13), 132602.
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