| 
Citations
 | 
   web
Voevodin, E. I., Gershenzon, E. M., Goltsman, G. N., & Ptitsina, N. G. (1989). Energy-spectrum of shallow acceptors in Ge deformed strongly by a uniaxial pressure. Sov. Phys. and Technics of Semiconductors, 23(8), 843–846.
toggle visibility
Boyarskii, D. A., Gershenzon, V. E., Gershenzon, E. M., Gol'tsman, G. N., Ptitsina, N. G., Tikhonov, V. V., et al. (1996). On the possibility of determining the microstructural parameters of an oil-bearing layer from radiophysical measurement data. J. of Communications Technology and Electronics, 41(5), 408–414.
toggle visibility
Gershenson, E. M., Gol'tsman, G. N., Elant'ev, A. I., Kagane, M. L., Multanovskii, V. V., & Ptitsina, N. G. (1983). Use of submillimeter backward-wave tube spectroscopy in determination of the chemical nature and concentration of residual impurities in pure semiconductors. Sov. Phys. Semicond., 17(8), 908–913.
toggle visibility
Voevodin, E. I., Gershenzon, E. M., Goltsman, G. N., Ptitsina, N. G., & Chulkova, G. M. (1988). Capture of free holes by charged acceptors in uniaxially deformed Ge. Fizika i Tekhnika Poluprovodnikov, 22(3), 540–543.
toggle visibility
Verevkin, A. A., Ptitsina, N. G., Chulcova, G. M., Gol'Tsman, G. N., Gershenzon, E. M., & Yngvesson, K. S. (1996). Determination of the limiting mobility of a two-dimensional electron gas in AlxGa1-xAs/GaAs heterostructures and direct measurement of the energy relaxation time. Phys. Rev. B Condens. Matter., 53(12), R7592–R7595.
toggle visibility