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Author | Title | Year | Publication | Volume | Pages |
---|---|---|---|---|---|
Galeazzi, Massimiliano | Fundamental noise processes in TES devices | 2011 | IEEE Trans. Appl. Supercond. | 21 | 267-271 |
Bennett, Douglas A.; Schmidt, Daniel R.; Swetz, Daniel S.; Ullom, Joel N. | Phase-slip lines as a resistance mechanism in transition-edge sensors | 2014 | Appl. Phys. Lett. | 104 | 042602 |