Heeres, R. W., Dorenbos, S. N., Koene, B., Solomon, G. S., Kouwenhoven, L. P., & Zwiller, V. (2010). On-Chip Single Plasmon Detection. Nano Lett., 10, 661–664.
Abstract: Surface plasmon polaritons (plasmons) have the potential to interface electronic and optical devices. They could prove extremely useful for integrated quantum information processing. Here we demonstrate on-chip electrical detection of single plasmons propagating along gold waveguides. The plasmons are excited using the single-photon emission of an optically emitting quantum dot. After propagating for several micrometers, the plasmons are coupled to a superconducting detector in the near-field. Correlation measurements prove that single plasmons are being detected.
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Gershenson, M. E., Gong, D., Sato, T., Karasik, B. S., & Sergeev, A. V. (2001). Millisecond electron-phonon relaxation in ultrathin disordered metal films at millikelvin temperatures. Appl. Phys. Lett., 79, 2049–2051.
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Ferrari, S., Kovalyuk, V., Hartmann, W., Vetter, A., Kahl, O., Lee, C., et al. (2017). Hot-spot relaxation time current dependence in niobium nitride waveguide-integrated superconducting nanowire single-photon detectors. Opt. Express, 25(8), 8739–8750.
Abstract: We investigate how the bias current affects the hot-spot relaxation dynamics in niobium nitride. We use for this purpose a near-infrared pump-probe technique on a waveguide-integrated superconducting nanowire single-photon detector driven in the two-photon regime. We observe a strong increase in the picosecond relaxation time for higher bias currents. A minimum relaxation time of (22 +/- 1)ps is obtained when applying a bias current of 50% of the switching current at 1.7 K bath temperature. We also propose a practical approach to accurately estimate the photon detection regimes based on the reconstruction of the measured detector tomography at different bias currents and for different illumination conditions.
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Siemsen, K. J., Bernard, J. E., Madej, A. A., & Marmet, L. (2001). Absolute frequency measurement of a CO2/OsO4 stabilized laser at 28.8 THz. Appl. Phys. B: Lasers and Optics, 72, 567–573.
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Gordon, N. T., Lees, D. J., Bowen, G., Phillips, T. S., Haigh, M., Jones, C. L., et al. (2006). HgCdTe detectors operating above 200 K. J. Electron. Mater., 35(6), 1140–1144.
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