| Author |
Title |
Year |
Publication |
Volume |
Pages |
| Floet D. W.; Gao J. R.; Klapwijk T. M.; de Korte P. A. J. |
Bias Dependence of the Thermal Time Constant in Nb Superconducting Diffusion-Cooled HEB Mixers |
2000 |
Appl. Phys. Lett. |
77 |
1719 |
| Manus, M. K. Mc; Kash, J. A.; Steen, S. E.; Polonsky, S.; Tsang, J.C.; Knebel, D. R.; Huott, W. |
PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis |
2000 |
Microelectronics Reliability |
40 |
1353-1358 |
| Cherednichenko, S.; Rönnung, F.; Gol'tsman, G.; Kollberg, E.; Winkler, D. |
YBa2Cu3O7−δ hot-electron bolometer mixer |
2000 |
Phys. C: Supercond. |
341-348 |
2653-2654 |
| Hübers, Heinz-Wilhelm; Semenov, Alexei; Schubert, Josef; Gol'tsman, Gregory; Voronov, Boris; Gershenzon, Evgeni |
Performance of the phonon-cooled hot-electron bolometric mixer between 0.7 THz and 5.2 THz |
2000 |
Proc. 8-th Int. Conf. on Terahertz Electronics |
|
117-119 |
| Huebers, H.-W.; Semenov, A.; Schubert, J.; Gol’tsman, G. N.; Voronov, B. M.; Gershenzon, E. M.; Krabbe, A.; Roeser, H.-P. |
NbN hot-electron bolometer as THz mixer for SOFIA |
2000 |
Proc. SPIE |
4014 |
195-202 |
