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Author |
Title |
Year |
Publication |
Volume |
Pages |
Links |
|
Il'in, K. S.; Lindgren, M.; Currie, M. A.; Semenov, D.; Gol'tsman, G. N.; Sobolewski, Roman; Cherednichenko, S. I.; Gershenzon, E. M. |
Picosecond hot-electron energy relaxation in NbN superconducting photodetectors |
2000 |
Appl. Phys. Lett. |
76 |
2752-2754 |
|
|
|
ГОСТ 2.711-82. ЕСКД. Схема деления изделия на составные части |
2000 |
|
|
|
|
|
Leisawitz, David T.; Danchi, William C.; Dipirro, Michael J.; Feinberg, Lee D.; Gezari, Daniel Y.; Hagopian, Mike; Langer, William D.; Mather, John C.; Moseley, Jr. Samuel H.; Shao, Michael; Silverberg, Robert F.; Staguhn, Johannes G.; Swain, Mark R.; Yorke, Harold W.; Zhang, Xiaolei |
Scientific motivation and technology requirements for the SPIRIT and SPECS far-infrared/submillimeter space interferometers |
2000 |
Proc. SPIE |
4013 |
36-46 |
|
|
Floet D. W.; Gao J. R.; Klapwijk T. M.; de Korte P. A. J. |
Bias Dependence of the Thermal Time Constant in Nb Superconducting Diffusion-Cooled HEB Mixers |
2000 |
Appl. Phys. Lett. |
77 |
1719 |
|
|
Manus, M. K. Mc; Kash, J. A.; Steen, S. E.; Polonsky, S.; Tsang, J.C.; Knebel, D. R.; Huott, W. |
PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis |
2000 |
Microelectronics Reliability |
40 |
1353-1358 |
|