| Author |
Title |
Year |
Publication |
Volume |
Pages |
| Takemoto, K.; Nambu, Y.; Miyazawa, T.; Sakuma, Y.; Yamamoto, T.; Yorozu, S.; Arakawa, Y. |
Quantum key distribution over 120 km using ultrahigh purity single-photon source and superconducting single-photon detectors |
2015 |
Sci. Rep. |
5 |
14383 |
| Korneev, A.; Divochiy, A.; Tarkhov, M.; Minaeva, O.; Seleznev, V.; Kaurova, N.; Voronov, B.; Okunev, O.; Chulkova, G.; Milostnaya, I.; Smirnov, K.; Gol’tsman, G. |
Superconducting NbN-nanowire single-photon detectors capable of photon number resolving |
2008 |
Supercond. News Forum |
|
|
| Sidorova, Maria V.; Divochiy, Alexander V.; Vakhtomin, Yury B.; Smirnov, Konstantin V. |
Ultrafast superconducting single-photon detector with a reduced active area coupled to a tapered lensed single-mode fiber |
2015 |
J. Nanophoton. |
9 |
093051 |
| Ozhegov, R.; Elezov, M.; Kurochkin, Y.; Kurochkin, V.; Divochiy, A.; Kovalyuk, V.; Vachtomin, Y.; Smirnov, K.; Goltsman, G. |
Quantum key distribution over 300 |
2014 |
Proc. SPIE |
9440 |
1F (1 to 9) |
| McCarthy, Aongus; Krichel, Nils J.; Gemmell, Nathan R.; Ren, Ximing; Tanner, Michael G.; Dorenbos, Sander N.; Zwiller, Val; Hadfield, Robert H.; Buller, Gerald S. |
Kilometer-range, high resolution depth imaging via 1560 nm wavelength single-photon detection |
2013 |
Opt. Express |
21 |
8904-8915 |
| Manus, M. K. Mc; Kash, J. A.; Steen, S. E.; Polonsky, S.; Tsang, J.C.; Knebel, D. R.; Huott, W. |
PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis |
2000 |
Microelectronics Reliability |
40 |
1353-1358 |
| Stellari, Franco; Song, Peilin |
Testing of ultra low voltage CMOS microprocessors using the superconducting single-photon detector (SSPD) |
2005 |
Proc. 12th IPFA |
|
2 |
| Marsili, F.; Verma, V. B.; Stern, J. A.; Harrington, S.; Lita, A. E.; Gerrits, T.; Vayshenker, I.; Baek, B.; Shaw, M. D.; Mirin, R. P.; Nam, S. W. |
Detecting single infrared photons with 93% system efficiency |
2013 |
Nat. Photon. |
7 |
210-214 |
| Kitaygorsky, J.; Zhang, J.; Verevkin, A.; Sergeev, A.; Korneev, A.; Matvienko, V.; Kouminov, P.; Smirnov, K.; Voronov, B.; Gol'tsman, G.; Sobolewski, R. |
Origin of dark counts in nanostructured NbN single-photon detectors |
2005 |
IEEE Trans. Appl. Supercond. |
15 |
545-548 |
| Zhang, Jin; Slysz, W.; Verevkin, A.; Okunev, O.; Chulkova, G.; Korneev, A.; Lipatov, A.; Gol'tsman, G. N.; Sobolewski, R. |
Response time characterization of NbN superconducting single-photon detectors |
2003 |
IEEE Trans. Appl. Supercond. |
13 |
180-183 |
