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Divochiy, A., Marsili, F., Bitauld, D., Gaggero, A., Leoni, R., Mattioli, F., et al. (2008). Superconducting nanowire photon-number-resolving detector at telecommunication wavelengths. Nat. Photon., 2(5), 302–306.
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Marsili, F., Verma, V. B., Stern, J. A., Harrington, S., Lita, A. E., Gerrits, T., et al. (2013). Detecting single infrared photons with 93% system efficiency. Nat. Photon., 7(3), 210–214.
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Pernice, W. H. P., Schuck, C., Minaeva, O., Li, M., Goltsman, G. N., Sergienko, A. V., et al. (2012). High-speed and high-efficiency travelling wave single-photon detectors embedded in nanophotonic circuits. Nat. Commun., 3, 1325 (1 to 10).
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Marksteiner, M., Divochiy, A., Sclafani, M., Haslinger, P., Ulbricht, H., Korneev, A., et al. (2009). A superconducting NbN detector for neutral nanoparticles. Nanotechnol., 20(45), 455501.
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Sclafani, M., Marksteiner, M., Keir, F. M. L., Divochiy, A., Korneev, A., Semenov, A., et al. (2012). Sensitivity of a superconducting nanowire detector for single ions at low energy. Nanotechnol., 23(6), 065501 (1 to 5).
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Fiore, A., Marsili, F., Bitauld, D., Gaggero, A., Leoni, R., Mattioli, F., et al. (2009). Counting photons using a nanonetwork of superconducting wires. In M. Cheng (Ed.), Nano-Net (pp. 120–122). Berlin, Heidelberg: Springer Berlin Heidelberg.
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Heeres, R. W., Dorenbos, S. N., Koene, B., Solomon, G. S., Kouwenhoven, L. P., & Zwiller, V. (2010). On-Chip Single Plasmon Detection. Nano Lett., 10, 661–664.
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Vetter, A., Ferrari, S., Rath, P., Alaee, R., Kahl, O., Kovalyuk, V., et al. (2016). Cavity-enhanced and ultrafast superconducting single-photon detectors. Nano Lett., 16(11), 7085–7092.
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Smirnov, K. V., Vakhtomin, Y. B., Divochiy, A. V., Ozhegov, R. V., Pentin, I. V., & Gol'tsman, G. N. (2010). Infrared and terahertz detectors on basis of superconducting nanostructures. In IEEE (Ed.), Microwave and Telecom. Technol. (CriMiCo), 20th Int. Crimean Conf. (pp. 823–824).
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Manus, M. K. M., Kash, J. A., Steen, S. E., Polonsky, S., Tsang, J. C., Knebel, D. R., et al. (2000). PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis. Microelectronics Reliability, 40, 1353–1358.
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