| Author |
Title |
Year |
Publication  |
Volume |
Pages |
| Fiore, A.; Marsili, F.; Bitauld, D.; Gaggero, A.; Leoni, R.; Mattioli, F.; Divochiy, A.; Korneev, A.; Seleznev, V.; Kaurova, N.; Minaeva, O.; Gol’tsman, G. |
Counting photons using a nanonetwork of superconducting wires |
2009 |
Nano-Net |
|
120-122 |
| Heeres, R.W.; Dorenbos, S.N.; Koene, B.; Solomon, G.S.; Kouwenhoven, L.P.; Zwiller, V. |
On-Chip Single Plasmon Detection |
2010 |
Nano Letters |
10 |
661-664 |
| Vetter, A.; Ferrari, S.; Rath, P.; Alaee, R.; Kahl, O.; Kovalyuk, V.; Diewald, S.; Goltsman, G. N.; Korneev, A.; Rockstuhl, C.; Pernice, W. H. P. |
Cavity-enhanced and ultrafast superconducting single-photon detectors |
2016 |
Nano Lett. |
16 |
7085-7092 |
| Smirnov, K. V.; Vakhtomin, Yu. B.; Divochiy, A. V.; Ozhegov, R. V.; Pentin, I. V.; Gol'tsman, G. N. |
Infrared and terahertz detectors on basis of superconducting nanostructures |
2010 |
Microwave and Telecom. Technol. (CriMiCo), 20th Int. Crimean Conf. |
|
823-824 |
| Manus, M. K. Mc; Kash, J. A.; Steen, S. E.; Polonsky, S.; Tsang, J.C.; Knebel, D. R.; Huott, W. |
PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis |
2000 |
Microelectronics Reliability |
40 |
1353-1358 |
