| Author |
Title |
Year |
Publication  |
DOI |
| Gershenzon, E. M.; Gurvich, Y. A.; Orlova, S. L.; Ptitsina, N. G. |
Scattering of electrons by charged impurities in Ge under cyclotron resonance conditions |
1976 |
Presumably: Sov. Phys. Semicond. | Физика и техника полупроводников |
|
| Bondarenko, O. I.; Gershenzon, E. M.; Gurvich, Y. A.; Orlova, S. L.; Ptitsina, N. G. |
Measurement of the width of the cyclotron resonance line of n-type Ge in quantizing magnetic fields |
1972 |
Presumably: Sov. Phys. Semicond. | Физика и техника полупроводников |
|
| Aksaev, E. E.; Gershenzon, E.M.; Gol'tsman, G. N.; Mirskij, G. I.; Semenov, A. D. |
Submillimetric spectrometer-relaxometer based on backward-wave tubes with picosecond time resolution |
1991 |
Pribory i Tekhnika Eksperimenta |
|
| Gershenzon, E. M.; Gol'tsman, G. N.; Mirskii, G. I. |
Submillimeter backward-wave-tube spectrometer-relaxometer |
1987 |
Pribory i Tekhnika Eksperimenta |
|
| Gershenzon, E. M.; Gol'tsman, G. N.; Semenov, A. D. |
Submillimeter backward wave tube spectrometer for measuring superconducting film transmission |
1983 |
Pribory i Tekhnika Eksperimenta |
|
