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Gershenzon, E. M., Gurvich, Y. A., Orlova, S. L., & Ptitsina, N. G. (1976). Scattering of electrons by charged impurities in Ge under cyclotron resonance conditions. Presumably: Sov. Phys. Semicond. | Физика и техника полупроводников, 10, 1379–1383.
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Bondarenko, O. I., Gershenzon, E. M., Gurvich, Y. A., Orlova, S. L., & Ptitsina, N. G. (1972). Measurement of the width of the cyclotron resonance line of n-type Ge in quantizing magnetic fields. Presumably: Sov. Phys. Semicond. | Физика и техника полупроводников, 6, 362–363.
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Aksaev, E. E., Gershenzon, E. M., Gol'tsman, G. N., Mirskij, G. I., & Semenov, A. D. (1991). Submillimetric spectrometer-relaxometer based on backward-wave tubes with picosecond time resolution. Pribory i Tekhnika Eksperimenta, 34(2), 125–131.
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Gershenzon, E. M., Gol'tsman, G. N., & Mirskii, G. I. (1987). Submillimeter backward-wave-tube spectrometer-relaxometer. Pribory i Tekhnika Eksperimenta, 30(4), 131–137.
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Gershenzon, E. M., Gol'tsman, G. N., & Semenov, A. D. (1983). Submillimeter backward wave tube spectrometer for measuring superconducting film transmission. Pribory i Tekhnika Eksperimenta, 26(5), 134–137.
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