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Gershenson, E. M., Gol'tsman, G. N., Elant'ev, A. I., Kagane, M. L., Multanovskii, V. V., & Ptitsina, N. G. (1983). Use of submillimeter backward-wave tube spectroscopy in determination of the chemical nature and concentration of residual impurities in pure semiconductors. Sov. Phys. Semicond., 17(8), 908–913.
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Gershenzon, E. M., Gol'tsman, G. N., Dzardanov, A. L., Elant'ev, A. I., Zorin, M. A., Markin, A. G., et al. (1992). S-N switching of niobium and YBCO films: limit time and perspective of fast key element creation. Sverkhprovodimost': Fizika, Khimiya, Tekhnika, 5(12), 2386–2402.
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