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Pentin, I., Vakhtomin, Y., Seleznev, V., & Smirnov, K. (2020). Hot electron energy relaxation time in vanadium nitride superconducting film structures under THz and IR radiation. Sci. Rep., 10(1), 16819.
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Kuzin, A., Elmanov, I., Kovalyuk, V., An, P., & Goltsman, G. (2020). Silicon nitride focusing grating coupler for input and output light of NV-centers. In Proc. 32-nd EMSS (pp. 349–353).
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Elmanov, I., Elmanova, A., Kovalyuk, V., An, P., & Goltsman, G. (2020). Integrated contra-directional coupler for NV-centers photon filtering. In Proc. 32-nd EMSS (pp. 354–360).
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Elmanov, I., Elmanova, A., Kovalyuk, V., An, P., & Goltsman, G. (2020). Silicon nitride photonic crystal cavity coupled with NV-centers in nanodiamonds. In Proc. 32-nd EMSS (pp. 344–348).
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Gorokhov, G., Bychanok, D., Gayduchenko, I., Rogov, Y., Zhukova, E., Zhukov, S., et al. (2020). THz spectroscopy as a versatile tool for filler distribution diagnostics in polymer nanocomposites. Polymers (Basel), 12(12), 3037 (1 to 14).
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Shein, K. V., Zarudneva, A. A., Emel’yanova, V. O., Logunova, M. A., Chichkov, V. I., Sobolev, A. S., et al. (2020). Superconducting microstructures with high impedance. Phys. Solid State, 62(9), 1539–1542.
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Sidorova, M., Semenov, A. D., Hübers, H. - W., Ilin, K., Siegel, M., Charaev, I., et al. (2020). Electron energy relaxation in disordered superconducting NbN films. Phys. Rev. B, 102(5), 054501 (1 to 15).
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Zhang, X., Lita, A. E., Smirnov, K., Liu, H. L., Zhu, D., Verma, V. B., et al. (2020). Strong suppression of the resistivity near the superconducting transition in narrow microbridges in external magnetic fields. Phys. Rev. B, 101(6), 060508 (1 to 6).
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Vodolazov, D. Y., Manova, N. N., Korneeva, Y. P., & Korneev, A. A. (2020). Timing jitter in NbN superconducting microstrip single-photon detector. Phys. Rev. Applied, 14(4), 044041 (1 to 8).
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Korneeva, Y. P., Manova, N. N., Florya, I. N., Mikhailov, M. Y., Dobrovolskiy, O. V., Korneev, A. A., et al. (2020). Different single-photon response of wide and narrow superconducting MoxSi1−x strips. Phys. Rev. Applied, 13(2), 024011 (1 to 7).
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