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  Author Title Year Publication (down) Volume Pages Links
Floet, D. Wilms; Baselmans, J. J. A.; Klapwijk, T. M.; Gao, J. R. Resistive transition of niobium superconducting hot-electron bolometer mixers 1998 Applied Physics Letters 73 2826 details   doi
Fu, K.; Zannoni, R.; Chan, C.; Adams, S. H.; Nicholson, J.; Polizzi, E.; Yngvesson, K. S. Terahertz detection in single wall carbon nanotubes 2008 Applied Physics Letters 92 033105 details   doi
Siddiqi, I.; Prober, D. E. Nb–Au bilayer hot-electron bolometers for low-noise THz heterodyne detection 2004 Applied Physics Letters 84 1404 details   doi
Barends, R.; Hajenius, M.; Gao, J. R.; Klapwijk, T. M. Current-induced vortex unbinding in bolometer mixers 2005 Applied Physics Letters 87 263506 (1 to 3) details   openurl
Zhang, W.; Khosropanah, P.; Gao, J. R.; Kollberg, E. L.; Yngvesson, K. S.; Bansal, T.; Barends, R.; Klapwijk, T. M. Quantum noise in a terahertz hot electron bolometer mixer 2010 Applied Physics Letters 96 111113-(1-3) details   openurl
Burke, P. J.; Schoelkopf, R. J.; Prober, D. E.; Skalare, A.; Karasik, B. S.; Gaidis, M. C.; McGrath, W. R.; Bumble, B.; Leduc, H. G. Spectrum of thermal fluctuation noise in diffusion and phonon cooled hot-electron mixers 1998 Applied Physics Letters 72 1516-1518 details   openurl
Gol’tsman, G. N.; Gershenzon, E. M. Phonon-cooled hot-electron bolometric mixer: overview of recent results 1999 Appl. Supercond. 6 649-655 details   doi
Baselmans, J. J. A.; Baryshev, A.; Reker, S. F.; Hajenius, M.; Gao, J. R.; Klapwijk, T. M.; Vahtomin, Yu.; Maslennikov, S.; Antipov, S.; Voronov, B.; Gol'tsman, G. Direct detection effect in small volume hot electron bolometer mixers 2005 Appl. Phys. Lett. 86 163503 (1 to 3) details   doi
Prober, D. E. Superconducting terahertz mixer using a transition-edge microbolometer 1993 Appl. Phys. Lett. 62 2119-2121 details   openurl
Lindgren, M.; Zorin, M. A.; Trifonov, V.; Danerud, M.; Winkler, D.; Karasik, B. S.; Gol'tsman, G. N.; Gershenzon, E. M. Optical mixing in a patterned YBa2Cu3O7-δ thin film 1994 Appl. Phys. Lett. 65 3398-3400 details   doi
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