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Author | Title | Year | Publication | DOI |
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Smirnov, K.; Korneev, A.; Minaeva, O.; Divochiy, A.; Tarkhov, M.; Ryabchun, S.; Seleznev, V.; Kaurova, N.; Voronov, B.; Gol'tsman, G.; Polonsky, S. | Ultrathin NbN film superconducting single-photon detector array | 2007 | J. Phys.: Conf. Ser. | 10.1088/1742-6596/61/1/214 |
Manus, M. K. Mc; Kash, J. A.; Steen, S. E.; Polonsky, S.; Tsang, J.C.; Knebel, D. R.; Huott, W. | PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis | 2000 | Microelectronics Reliability | 10.1016/S0026-2714(00)00137-2 |