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Елезов, М. С., Тархов, М. А., Дивочий, А. В., Вахтомин, Ю. Б., & Гольцман, Г. Н. (2010). Система регистрации одиночных фотонов в видимом и ближнем инфракрасном диапазонах. In Науч. сессия НИЯУ МИФИ (pp. 94–95).
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Marsili, F., Bitauld, D., Fiore, A., Gaggero, A., Mattioli, F., Leoni, R., et al. (2010). Photon-number-resolution at telecom wavelength with superconducting nanowires. IntechOpen [DOI:10.5772/6920]. Retrieved July 4, 2024, from http://dx.doi.org/10.5772/6920.
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Milostnaya, I., Korneev, A., Tarkhov, M., Divochiy, A., Minaeva, O., Seleznev, V., et al. (2008). Superconducting single photon nanowire detectors development for IR and THz applications. J. Low Temp. Phys., 151(1-2), 591–596.
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Korneev, A. A., Divochiy, A. V., Vakhtomin, Y. B., Korneeva, Y. P., Larionov, P. A., Manova, N. N., et al. (2013). IR single-photon receiver based on ultrathin NbN superconducting film. Rus. J. Radio Electron., (5).
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Takemoto, K., Nambu, Y., Miyazawa, T., Sakuma, Y., Yamamoto, T., Yorozu, S., et al. (2015). Quantum key distribution over 120 km using ultrahigh purity single-photon source and superconducting single-photon detectors. Sci. Rep., 5, 14383.
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Korneev, A., Divochiy, A., Tarkhov, M., Minaeva, O., Seleznev, V., Kaurova, N., et al. (2008). Superconducting NbN-nanowire single-photon detectors capable of photon number resolving. In Supercond. News Forum.
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Sidorova, M. V., Divochiy, A. V., Vakhtomin, Y. B., & Smirnov, K. V. (2015). Ultrafast superconducting single-photon detector with a reduced active area coupled to a tapered lensed single-mode fiber. J. Nanophoton., 9(1), 093051.
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Smirnov, K. V., Vakhtomin, Y. B., Divochiy, A. V., Ozhegov, R. V., Pentin, I. V., Slivinskaya, E. V., et al. (2009). Single-photon detectors for the visible and infrared parts of the spectrum based on NbN nanostructures. In Proc. Progress In Electromagnetics Research Symp. (pp. 863–864). Moscow, Russia.
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McCarthy, A., Krichel, N. J., Gemmell, N. R., Ren, X., Tanner, M. G., Dorenbos, S. N., et al. (2013). Kilometer-range, high resolution depth imaging via 1560 nm wavelength single-photon detection. Opt. Express, 21(7), 8904–8915.
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Manus, M. K. M., Kash, J. A., Steen, S. E., Polonsky, S., Tsang, J. C., Knebel, D. R., et al. (2000). PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis. Microelectronics Reliability, 40, 1353–1358.
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