| Records |
| Author |
Smolyaninov, I. I.; Zayats, A. V.; Stanishevsky, A.; Davis, C. C. |
| Title |
Optical control of photon tunneling through an array of nanometer-scale cylindrical channels |
Type |
Journal Article |
| Year |
2002 |
Publication |
Phys. Rev. B |
Abbreviated Journal |
Phys. Rev. B |
| Volume |
66 |
Issue |
20 |
Pages |
205414_1-205414_5 |
| Keywords |
optical mixing |
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| ISSN |
1098-0121 |
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499 |
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| Author |
Su, M. Y.; Carter, S. G.; Sherwin, M. S. |
| Title |
Strong-field terahertz optical mixing in excitons |
Type |
Journal Article |
| Year |
2003 |
Publication |
Phys. Rev. B |
Abbreviated Journal |
Phys. Rev. B |
| Volume |
67 |
Issue |
12 |
Pages |
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| Keywords |
optical mixing |
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1098-0121 |
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no |
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500 |
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| Author |
Ciulin, V.; Carter, S. G.; Sherwin, M. S. |
| Title |
Terahertz optical mixing in biased GaAs single quantum wells |
Type |
Journal Article |
| Year |
2004 |
Publication |
Phys. Rev. B |
Abbreviated Journal |
Phys. Rev. B |
| Volume |
70 |
Issue |
11 |
Pages |
115312-(1-6) |
| Keywords |
optical mixing |
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1098-0121 |
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no |
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501 |
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| Author |
Semenov, A.; Goltsman, G.; Korneev, A. |
| Title |
Quantum detection by current carrying superconducting film |
Type |
Journal Article |
| Year |
2001 |
Publication |
Phys. C: Supercond. |
Abbreviated Journal |
Phys. C: Supercond. |
| Volume |
351 |
Issue |
4 |
Pages |
349-356 |
| Keywords |
quantum detection, phase slip centers, quasiparticle diffusion |
| Abstract |
We describe a novel quantum detection mechanism in the superconducting film carrying supercurrent. The mechanism incorporates growing normal domain and breaking of superconductivity by the bias current. A single photon absorbed in the film creates transient normal spot that causes redistribution of the current and, consequently, increase of the current density in superconducting areas. When the current density exceeds the critical value, the film switches into resistive state and generates the voltage pulse. Analysis shows that a submicron-wide film of conventional low temperature superconductor operated in liquid helium may detect single far-infrared photon. The amplitude and duration of the voltage pulse are in the millivolt and picosecond range, respectively. The quantitative model is presented that allows simulation of the detector utilizing this detection mechanism. |
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0921-4534 |
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507 |
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| Author |
Sobolewski, R.; Verevkin, A.; Gol'tsman, G.N.; Lipatov, A.; Wilsher, K. |
| Title |
Ultrafast superconducting single-photon optical detectors and their applications |
Type |
Journal Article |
| Year |
2003 |
Publication |
IEEE Trans. Appl. Supercond. |
Abbreviated Journal |
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| Volume |
13 |
Issue |
2 |
Pages |
1151-1157 |
| Keywords |
NbN SSPD, SNSPD |
| Abstract |
We present a new class of ultrafast single-photon detectors for counting both visible and infrared photons. The detection mechanism is based on photon-induced hotspot formation, which forces the supercurrent redistribution and leads to the appearance of a transient resistive barrier across an ultrathin, submicrometer-width, superconducting stripe. The devices were fabricated from 3.5-nm- and 10-nm-thick NbN films, patterned into <200-nm-wide stripes in the 4 /spl times/ 4-/spl mu/m/sup 2/ or 10 /spl times/ 10-/spl mu/m/sup 2/ meander-type geometry, and operated at 4.2 K, well below the NbN critical temperature (T/sub c/=10-11 K). Continuous-wave and pulsed-laser optical sources in the 400-nm-to 3500-nm-wavelength range were used to determine the detector performance in the photon-counting mode. Experimental quantum efficiency was found to exponentially depend on the photon wavelength, and for our best, 3.5-nm-thick, 100-/spl mu/m/sup 2/-area devices varied from >10% for 405-nm radiation to 3.5% for 1550-nm photons. The detector response time and jitter were /spl sim/100 ps and 35 ps, respectively, and were acquisition system limited. The dark counts were below 0.01 per second at optimal biasing. In terms of the counting rate, jitter, and dark counts, the NbN single-photon detectors significantly outperform their semiconductor counterparts. Already-identified applications for our devices range from noncontact testing of semiconductor CMOS VLSI circuits to free-space quantum cryptography and communications. |
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1051-8223 |
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no |
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509 |
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