|
Author |
Title |
Year |
Publication |
Volume |
Pages |
Links |
|
Смирнов, Константин Владимирович |
Энергетическая релаксация электронов в 2D-канале гетеропереходов GAAS/ALGAAS и транспортные процессы в структурах полупроводник-сверхпроводник на их основе |
2000 |
М. МПГУ |
|
|
|
|
Smirnov, K. V.; Ptitsina, N. G.; Vakhtomin, Y. B.; Verevkin, A. A.; Gol’tsman, G. N.; Gershenzon, E. M. |
Energy relaxation of two-dimensional electrons in the quantum Hall effect regime |
2000 |
JETP Lett. |
71 |
31-34 |
|
|
Semenov, A. D.; Gol’tsman, G. N. |
Nonthermal mixing mechanism in a diffusion-cooled hot-electron detector |
2000 |
J. Appl. Phys. |
87 |
502-510 |
|
|
Cherednichenko, S.; Kroug, M.; Yagoubov, P.; Merkel, H.; Kollberg, E.; Yngvesson, K. S.; Voronov, B.; Gol’tsman, G. |
IF bandwidth of phonon cooled HEB mixers made from NbN films on MgO substrates |
2000 |
Proc. 11th Int. Symp. Space Terahertz Technol. |
|
219-227 |
|
|
Cherednichenko, S.; Rönnung, F.; Gol’tsman, G.; Kollberg, E.; Winkler, D. |
YBa2Cu3O7-δ hot-electron bolometer mixer at 0.6 THz |
2000 |
Proc. 11th Int. Symp. Space Terahertz Technol. |
|
517-522 |
|
|
Darula, Marian; Semenov, Alex D.; Hübers, Heinz-Wilhelm; Schubert, Josef |
Quasioptical high-Tc superconductor Josephson mixer at terahertz frequencies |
2000 |
Proc. 11th Int. Symp. Space Terahertz Technol. |
|
515 |
|
|
Huebers, H.-W.; Semenov, A.; Schubert, J.; Gol’tsman, G. N.; Voronov, B. M.; Gershenzon, E. M.; Krabbe, A.; Roeser, H.-P. |
NbN hot-electron bolometer as THz mixer for SOFIA |
2000 |
Proc. SPIE |
4014 |
195-202 |
|
|
Hübers, Heinz-Wilhelm; Semenov, Alexei; Schubert, Josef; Gol'tsman, Gregory; Voronov, Boris; Gershenzon, Evgeni |
Performance of the phonon-cooled hot-electron bolometric mixer between 0.7 THz and 5.2 THz |
2000 |
Proc. 8-th Int. Conf. on Terahertz Electronics |
|
117-119 |
|
|
Cherednichenko, S.; Rönnung, F.; Gol'tsman, G.; Kollberg, E.; Winkler, D. |
YBa2Cu3O7−δ hot-electron bolometer mixer |
2000 |
Phys. C: Supercond. |
341-348 |
2653-2654 |
|
|
Manus, M. K. Mc; Kash, J. A.; Steen, S. E.; Polonsky, S.; Tsang, J.C.; Knebel, D. R.; Huott, W. |
PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis |
2000 |
Microelectronics Reliability |
40 |
1353-1358 |
|