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| Author |
Deang, Jennifer; Du, Qiang; Gunzburger, Max D. |
| Title |
Modeling and computation of random thermal fluctuations and material defects in the Ginzburg–Landau model for superconductivity |
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| Year |
2002 |
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J. Comp. Phys. |
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181 |
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1 |
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45-67 |
| Keywords |
noise; superconductivity; finite element methods; fluctuations. |
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It is well known that thermal fluctuations and material impurities affect the motion of vortices in superconductors. These effects are modeled by variants of a time-dependent Ginzburg-Landau model containing either additive or multiplicative noise. Numerical computations are presented that illustrate the effects that noise has on the dynamics of vortex nucleation and vortex motion. For an additive noise model with relatively low variances, it is found that the vortices form a quasi-steady-state lattice in which the vortex core sizes remain roughly fixed but their positions vibrate. Two multiplicative noise models are considered. For one model having relatively long-range order, the sizes of the vortex cores vary in time and from one vortex to another. Finally, for the additive noise case, we show that as the variance of the noise tends to zero, solutions of the stochastic time-dependent Ginzburg-Landau equations converge to solutions of the corresponding equations with no noise. |
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RPLAB @ gujma @ |
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758 |
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Hoevers, H. F. C.; Bento, A. C.; Bruijn, M. P.; Gottardi, L.; Korevaar, M. A. N.; Mels, W. A.; de Korte, P. A. J. |
| Title |
Thermal fluctuation noise in a voltage biased superconducting transition edge thermometer |
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Journal Article |
| Year |
2000 |
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Applied Physics Letters |
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Appl. Phys. Lett. |
| Volume |
77 |
Issue |
26 |
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4421-4424 |
| Keywords |
TES; bolometer; thermal fluctuation noise; TFN |
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The current noise at the output of a microcalorimeter with a voltage biased superconducting transition edge thermometer is studied in detail. In addition to the two well-known noise sources: thermal fluctuation noise from the heat link to the bath and Johnson noise from the resistive thermometer, a third noise source strongly correlated with the steepness of the thermometer is required to fit the measured noise spectra. Thermal fluctuation noise, originating in the thermometer itself, fully explains the additional noise. A simple model provides quantitative agreement between the observed and calculated noise spectra for all bias points in the superconducting transition. |
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759 |
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Burke, P. J.; Schoelkopf, R. J.; Prober, D. E.; Skalare, A.; Karasik, B. S.; Gaidis, M. C.; McGrath, W. R.; Bumble, B.; Leduc, H. G. |
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Spectrum of thermal fluctuation noise in diffusion and phonon cooled hot-electron mixers |
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Journal Article |
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1998 |
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Applied Physics Letters |
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Appl. Phys. Lett. |
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72 |
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12 |
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1516-1518 |
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HEB mixer; thermal fluctuation noise; TFN |
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A systematic study of the intermediate frequency noise bandwidth of Nb thin-film superconducting hot-electron bolometers is presented. We have measured the spectrum of the output noise as well as the conversion efficiency over a very broad intermediate frequency range (from 0.1 to 7.5 GHz) for devices varying in length from 0.08 μm to 3 μm. Local oscillator and rf signals from 8 to 40 GHz were used. For a device of a given length, the spectrum of the output noise and the conversion efficiency behave similarly for intermediate frequencies less than the gain bandwidth, in accordance with a simple thermal model for both the mixing and thermal fluctuation noise. For higher intermediate frequencies the conversion efficiency decreases; in contrast, the noise decreases but has a second contribution which dominates at higher frequency. The noise bandwidth is larger than the gain bandwidth, and the mixer noise is low, between 120 and 530 K (double side band). |
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760 |
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Yagoubov, P.; Kroug, M.; Merkel, H.; Kollberg, E.; Gol'tsman, G.; Svechnikov, S.; Gershenzon, E. |
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Noise temperature and local oscillator power requirement of NbN phonon-cooled hot electron bolometric mixers at terahertz frequencies |
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Journal Article |
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1998 |
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Appl. Phys. Lett. |
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Appl. Phys. Lett. |
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73 |
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19 |
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2814-2816 |
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NbN HEB mixers, noise temperature, local oscillator power |
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In this letter, the noise performance of NbN-based phonon-cooled hot electron bolometric quasioptical mixers is investigated in the 0.55–1.1 THz frequency range. The best results of the double-sideband <cd><2018>DSB<cd><2019> noise temperature are: 500 K at 640 GHz, 600 K at 750 GHz, 850 K at 910 GHz, and 1250 K at 1.1 THz. The water vapor in the signal path causes significant contribution to the measured receiver noise temperature around 1.1 THz. The devices are made from 3-nm-thick NbN film on high-resistivity Si and integrated with a planar spiral antenna on the same substrate. The in-plane dimensions of the bolometer strip are typically 0.2Ï«2 um. The amount of local oscillator power absorbed in the bolometer is less than 100 nW. |
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911 |
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Galeazzi, Massimiliano |
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Fundamental noise processes in TES devices |
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Journal Article |
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2011 |
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IEEE Trans. Appl. Supercond. |
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IEEE Trans. Appl. Supercond. |
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21 |
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3 |
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267-271 |
| Keywords |
TES, Johnson noise, phonon noise, excess noise, flux-flow noise, thermal fluctuation noise |
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Microcalorimeters and bolometers are noise-limited devices, therefore, a proper understanding of all noise sources is essential to predict and interpret their performance. In this paper, I review the fundamental noise processes contributing to Transition Edge Sensor (TES) microcalorimeters and bolometers and their effect on device performance. In particular, I will start with a simple, monolithic device model, moving to a more complex one involving discrete components, to finally move to today's more realistic, comprehensive model. In addition to the basic noise contribution (equilibrium Johnson noise and phonon noise), TES are significantly affected by extra noise, which is commonly referred to as excess noise. Different fundamental processes have been proposed and investigated to explain the origin of this excess noise, in particular near equilibrium non-linear Johnson noise, flux-flow noise, and internal thermal fluctuation noise. Experimental evidence shows that all three processes are real and contribute, at different levels, to the TES noise, although different processes become important at different regimes. It is therefore time to discard the term “excess noise” and consider these terms part of the “fundamental noise processes” instead. |
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Recommended by Klapwijk |
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914 |
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