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Author Novotny, Lukas
Title (up) Effective wavelength scaling for optical antennas Type Journal Article
Year 2007 Publication Phys. Rev. Lett. Abbreviated Journal Phys. Rev. Lett.
Volume 98 Issue 26 Pages 266802(1-4)
Keywords optical antennas
Abstract In antenna theory, antenna parameters are directly related to the wavelength λ of incident radiation, but this scaling fails at optical frequencies where metals behave as strongly coupled plasmas. In this Letter we show that antenna designs can be transferred to the optical frequency regime by replacing λ by a linearly scaled effective wavelength λeff=n1+n2λ/λp, with λp being the plasma wavelength and n1, n2 being coefficients that depend on geometry and material properties. It is assumed that the antenna is made of linear segments with radii Râ‰<aa>λ. Optical antennas hold great promise for increasing the efficiency of photovoltaics, light-emitting devices, and optical sensors.
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Call Number RPLAB @ gujma @ Serial 749
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Author Coumou, P. C. J. J.; Driessen, E. F. C.; Bueno, J.; Chapelier, C.; Klapwijk, T. M.
Title (up) Electrodynamic response and local tunneling spectroscopy of strongly disordered superconducting TiN films Type Journal Article
Year 2013 Publication Phys. Rev. B Abbreviated Journal
Volume 88 Issue 18 Pages 180505 (1 to 5)
Keywords strongly disordered superconducting TiN films, microwave resonators
Abstract We have studied the electrodynamic response of strongly disordered superconducting TiN films using microwave resonators, where the disordered superconductor is the resonating element in a high-quality superconducting environment of NbTiN. We describe the response assuming an effective pair-breaking mechanism modifying the density of states and compare this to local tunneling spectra obtained using scanning tunneling spectroscopy. For the least disordered film (kFl=8.7, Rs=13Ω), we find good agreement, whereas for the most disordered film (kFl=0.82, Rs=4.3kΩ), there is a strong discrepancy, which signals the breakdown of a model based on uniform properties.
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Call Number Serial 1069
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Author Shytov, A. V.; Levitov, L. S.; Beenakker, C. W. J.
Title (up) Electromechanical noise in a diffusive conductor Type Journal Article
Year 2002 Publication Phys. Rev. Lett. Abbreviated Journal Phys. Rev. Lett.
Volume 88 Issue 22 Pages
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Abstract Electrons moving in a conductor can transfer momentum to the lattice via collisions with impurities and boundaries, giving rise to a fluctuating mechanical stress tensor. The root-mean-squared momentum transfer per scattering event in a disordered metal (of dimension L greater than the mean free path l and screening length xi) is found to be reduced below the Fermi momentum by a factor of order l/L for shear fluctuations and (xi/L)^2 for pressure fluctuations. The excitation of an elastic bending mode by the shear fluctuations is estimated to fall within current experimental sensitivity for a nanomechanical oscillator.
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ISSN 0031-9007 ISBN Medium
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Notes Approved no
Call Number RPLAB @ s @ Serial 433
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Author Sidorova, M.; Semenov, Alexej D.; Hübers, H.-W.; Ilin, K.; Siegel, M.; Charaev, I.; Moshkova, M.; Kaurova, N.; Goltsman, G. N.; Zhang, X.; Schilling, A.
Title (up) Electron energy relaxation in disordered superconducting NbN films Type Journal Article
Year 2020 Publication Phys. Rev. B Abbreviated Journal Phys. Rev. B
Volume 102 Issue 5 Pages 054501 (1 to 15)
Keywords NbN SSPD, SNSPD, HEB, bandwidth, relaxation time
Abstract We report on the inelastic-scattering rate of electrons on phonons and relaxation of electron energy studied by means of magnetoconductance, and photoresponse, respectively, in a series of strongly disordered superconducting NbN films. The studied films with thicknesses in the range from 3 to 33 nm are characterized by different Ioffe-Regel parameters but an almost constant product qTl (qT is the wave vector of thermal phonons and l is the elastic mean free path of electrons). In the temperature range 14–30 K, the electron-phonon scattering rates obey temperature dependencies close to the power law 1/τe−ph∼Tn with the exponents n≈3.2–3.8. We found that in this temperature range τe−ph and n of studied films vary weakly with the thickness and square resistance. At 10 K electron-phonon scattering times are in the range 11.9–17.5 ps. The data extracted from magnetoconductance measurements were used to describe the experimental photoresponse with the two-temperature model. For thick films, the photoresponse is reasonably well described without fitting parameters, however, for thinner films, the fit requires a smaller heat capacity of phonons. We attribute this finding to the reduced density of phonon states in thin films at low temperatures. We also show that the estimated Debye temperature in the studied NbN films is noticeably smaller than in bulk material.
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ISSN 2469-9950 ISBN Medium
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Notes Approved no
Call Number Serial 1266
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Author Huard, B.; Pothier, H.; Esteve, D.; Nagaev, K. E.
Title (up) Electron heating in metallic resistors at sub-Kelvin temperature Type Journal Article
Year 2007 Publication Phys. Rev. B Abbreviated Journal Phys. Rev. B
Volume 76 Issue Pages 165426(1-9)
Keywords electron heating in resistor, HEB distributed model, HEB model, hot electrons
Abstract In the presence of Joule heating, the electronic temperature in a metallic resistor placed at sub-Kelvin temperatures can significantly exceed the phonon temperature. Electron cooling proceeds mainly through two processes: electronic diffusion to and from the connecting wires and electron-phonon coupling. The goal of this paper is to present a general solution of the problem in a form that can easily be used in practical situations. As an application, we compute two quantities that depend on the electronic temperature profile: the second and the third cumulant of the current noise at zero frequency, as a function of the voltage across the resistor. We also consider time-dependent heating, an issue relevant for experiments in which current pulses are used, for instance, in time-resolved calorimetry experiments.
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Notes Recommended by Klapwijk as example for writing the article on the HEB model. Approved no
Call Number Serial 936
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