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Author Title (down) Year Publication Volume Pages
Gol’tsman, G. N.; Okunev, O.; Chulkova, G.; Lipatov, A.; Semenov, A.; Smirnov, K.; Voronov, B.; Dzardanov, A.; Williams, C.; Sobolewski, R. Picosecond superconducting single-photon optical detector 2001 Appl. Phys. Lett. 79 705-707
Lindgren, M.; Currie, M.; Zeng, W.-S.; Sobolewski, R.; Cherednichenko, S.; Voronov, B.; Gol'tsman, G. N. Picosecond response of a superconducting hot-electron NbN photodetector 1998 Appl. Supercond. 6 423-428
Manus, M. K. Mc; Kash, J. A.; Steen, S. E.; Polonsky, S.; Tsang, J.C.; Knebel, D. R.; Huott, W. PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis 2000 Microelectronics Reliability 40 1353-1358
Korneev, Alexander; Golt'sman, Gregory; Pernice, Wolfram Photonic integration meets single-photon detection 2015 Laser Focus World 51 47-50
Zolotov, P.; Divochiy, A.; Vakhtomin, Y.; Moshkova, M.; Morozov, P.; Seleznev, V.; Smirnov, K. Photon-number-resolving SSPDs with system detection efficiency over 50% at telecom range 2018 Proc. AIP Conf. 1936 020019