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Author Title (down) Year Publication Volume Pages
Shcherbatenko, M.; Lobanov, Y.; Kovalyuk, V.; Korneev, A.; Gol'tsman, G. N. Photon counting detector as a mixer with picowatt local oscillator power requirement 2016 Proc. 27th Int. Symp. Space Terahertz Technol. 110
Gol’tsman, G.N. Overview of recent results for superconducting NbN terahertz and optical detectors and mixers 2014 SM2 – Seminar on Terahertz Photonics 0562
Kitaygorsky, J.; Zhang, J.; Verevkin, A.; Sergeev, A.; Korneev, A.; Matvienko, V.; Kouminov, P.; Smirnov, K.; Voronov, B.; Gol'tsman, G.; Sobolewski, R. Origin of dark counts in nanostructured NbN single-photon detectors 2005 IEEE Trans. Appl. Supercond. 15 545-548
Korneeva, Y. P.; Vodolazov, D. Y.; Semenov, A. V.; Florya, I. N.; Simonov, N.; Baeva, E.; Korneev, A. A.; Goltsman, G. N.; Klapwijk, T. M. Optical single-photon detection in micrometer-scale NbN bridges 2018 Phys. Rev. Applied 9 064037 (1 to 13)
Korneeva, Y. P.; Vodolazov, D. Y.; Semenov, A. V.; Florya, I. N.; Simonov, N.; Baeva, E.; Korneev, A. A.; Goltsman, G. N.; Klapwijk, T. M. Optical single photon detection in micron-scaled NbN bridges 2018 arXiv
Heeres, R.W.; Dorenbos, S.N.; Koene, B.; Solomon, G.S.; Kouwenhoven, L.P.; Zwiller, V. On-Chip Single Plasmon Detection 2010 Nano Letters 10 661-664
Kovalyuk, V.; Ferrari, S.; Kahl, O.; Semenov, A.; Shcherbatenko, M.; Lobanov, Y.; Ozhegov, R.; Korneev, A.; Kaurova, N.; Voronov, B.; Pernice, W.; Gol'tsman, G. On-chip coherent detection with quantum limited sensitivity 2017 Sci Rep 7 4812
Bell, M.; Kaurova, N.; Divochiy, A.; Gol'tsman, G.; Bird, J.; Sergeev, A.; Verevkin, A. On the nature of resistive transition in disordered superconducting nanowires 2007 IEEE Trans. Appl. Supercond. 17 267-270
Schroeder, E.; Mauskopf, P.; Pilyavsky, G.; Sinclair, A.; Smith, N.; Bryan, S.; Mani, H.; Morozov, D.; Berggren, K.; Zhu, D.; Smirnov, K.; Vakhtomin, Y. On the measurement of intensity correlations from laboratory and astronomical sources with SPADs and SNSPDs 2016 Proc. SPIE 9907 99070P (1 to 13)
Zhang, J.; Boiadjieva, N.; Chulkova, G.; Deslandes, H.; Gol'tsman, G. N.; Korneev, A.; Kouminov, P.; Leibowitz, M.; Lo, W.; Malinsky, R.; Okunev, O.; Pearlman, A.; Slysz, W.; Smirnov, K.; Tsao, C.; Verevkin, A.; Voronov, B.; Wilsher, K.; Sobolewski, R. Noninvasive CMOS circuit testing with NbN superconducting single-photon detectors 2003 Electron. Lett. 39 1086-1088