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González, F. J., & Boreman, G. D. (2005). Comparison of dipole, bowtie, spiral and log-periodic IR antennas. Inf Phys & Technol, 46(5), 418–428.
Abstract: Antenna-coupled microbolometers use planar lithographic antennas to couple infrared radiation into a bolometer with sub-micron dimensions. In this paper four different types of infrared antennas were fabricated on thin grounded-substrates and coupled to microbolometers. Dipole, bowtie, spiral and log-periodic IR antenna-coupled detectors were measured at 10.6 μm and their performance compared. A new method to calculate the radiation efficiency based on the spatial and angular response of infrared antennas is presented and used to evaluate their performance. The calculated radiation efficiency for the dipole, bowtie, spiral and log-periodic IR antennas was 20%, 37%, 25% and 46% respectively. A dipole-length study was performed and shows that the quasistatic value of the effective permittivity accurately describes the incident wavelength in the substrate at infrared frequencies for antennas on a thin substrate.
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Brown, E. R., Lee, A. W. M., Navi, B. S., & Bjarnason, J. E. (2006). Characterization of a planar self-complementary square-spiral antenna in the THz region. Microwave Opt Technol Lett, 48(3), 524–529.
Abstract: This paper describes a compact, self-complementary square-spiral antenna on a GaAs substrate with a broadside high-directivity (~9 dB) frequency-independent pattern when coupled through a silicon hyperhemisphere. The driving-point resistance undulates between ~00 and 300Ω from 200 GHz to 1 THz—much higher than the 72Ω value from Booker's modified formula, but quite beneficial for coupling to high-impedance broadband devices
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Novotny, L., & van Hulst, N. (2011). Antennas for light. Nat. Photon., 5(2), 83–90.
Abstract: Optical antennas are devices that convert freely propagating optical radiation into localized energy, and vice versa. They enable the control and manipulation of optical fields at the nanometre scale, and hold promise for enhancing the performance and efficiency of photodetection, light emission and sensing. Although many of the properties and parameters of optical antennas are similar to their radiowave and microwave counterparts, they have important differences resulting from their small size and the resonant properties of metal nanostructures. This Review summarizes the physical properties of optical antennas, provides a summary of some of the most important recent developments in the field, discusses the potential applications and identifies the future challenges and opportunities.
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Gonzalez, F. J., Ilic, B., Alda, J., & Boreman, G. D. (2005). Antenna-coupled infrared detectors for imaging applications. IEEE J. Sel. Topics Quantum Electron., 11(1), 117–120.
Abstract: Infrared focal plane arrays (IRFPAs) are a critical component in advanced infrared imaging systems. IRFPAs are made up of two parts, a detector array and a readout integrated circuit (ROIC) multiplexer. Current ROIC technology has typical pitch sizes of 20×20 to 50×50 μm2. In order to make antenna-coupled detectors suited for infrared imaging systems, two-dimensional (2-D) arrays have been fabricated that cover a whole pixel area with the penalty of increasing the noise figure of the detector and, therefore, reducing its performance. By coupling a Fresnel zone plate lens to a single element antenna-coupled detector, infrared radiation can be collected over a typical pixel area and still keep low-noise levels. A Fresnel zone plate lens coupled to a single-element square-spiral-coupled infrared detector has been fabricated and its performance compared to single element antenna-coupled detectors and 2-D arrays of antenna coupled detectors. Measurements made at 10.6 μm showed a two-order-of-magnitude increase in SNR and a ~× increase in D* as compared to 2-D arrays of antenna-coupled detectors.
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Boreman, G. D. (2001). A Users guide to IR detectors. In Proc. SPIE (Vol. 4420, pp. 79–90).
Abstract: This paper will guide the first-time user toward proper selection and use of IR detectors for applications in industrial inspection, process control, and laser measurements.
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