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Matyushkin, Y. E.; Gayduchenko, I. A.; Moskotin, M. V.; Goltsman, G. N.; Fedorov, G. E.; Rybin, M. G.; Obraztsova, E. D. Graphene-layer and graphene-nanoribbon FETs as THz detectors 2018 J. Phys.: Conf. Ser. 1124 051054 details   doi
Dieleman, Piter Fundamental limitations of THz niobium and niobiumnitride SIS mixers 1998 details   pdf openurl
Ovchinnikov, Yu. N.; Varlamov, A. A. Fluctuation-dissipative phenomena in a narrow superconducting channel carrying current below critical 2009 arXiv 0910.2659v1 1-4 details   url
Ptitsina, N. G.; Chulkova, G. M.; Il’in, K. S.; Sergeev, A. V.; Pochinkov, F. S.; Gershenzon, E. M.; Gershenson, M. E. Electron-phonon interaction in disordered metal films: The resistivity and electron dephasing rate 1997 Phys. Rev. B 56 10089-10096 details   doi
Huard, B.; Pothier, H.; Esteve, D.; Nagaev, K. E. Electron heating in metallic resistors at sub-Kelvin temperature 2007 Phys. Rev. B 76 165426(1-9) details   doi
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