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Bondarenko, O. I.; Gershenzon, E. M.; Gurvich, Y. A.; Orlova, S. L.; Ptitsina, N. G. Measurement of the width of the cyclotron resonance line of n-type Ge in quantizing magnetic fields 1972 Presumably: Sov. Phys. Semicond. | Физика и техника полупроводников details   url
Gershenzon, E. M.; Gol’tsman, G. N.; Semenov, A. D.; Sergeev, A. V. Mechanism of picosecond response of granular YBaCuO films to electromagnetic radiation 1991 IEEE Trans. Magn. 10.1109/20.133428 details   doi
Gershenzon, E. M.; Gol'tsman, G. N.; Semenov, A. D.; Sergeev, A. V. Mechanism of picosecond response of granular YBaCuO films to electromagnetic radiation 1990 Solid State Communications 10.1016/0038-1098(90)90656-V details   doi
Baubert, J.; Salez, M.; Delorme, Y.; Pons, P.; Goltsman, G.; Merkel, H.; Leconte, B. Membrane-based HEB mixer for THz applications 2003 Proc. SPIE 10.1117/12.499158 details   doi
Elmanov, I.; Elmanova, A.; Komrakova, S.; Golikov, A.; Kaurova, N.; Kovalyuk, V.; Goltsman, G.; Arakelyan, S.; Evlyukhin, A.; Kalachev, A.; Naumov, A. Method for determination of resists parameters for photonic – integrated circuits e-beam lithography on silicon nitride platform 2019 EPJ Web Conf. 10.1051/epjconf/201922003012 details   doi
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