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Author |
Title ![sorted by Title field, ascending order (up)](img/sort_asc.gif) |
Year |
Publication |
Links |
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Bondarenko, O. I.; Gershenzon, E. M.; Gurvich, Y. A.; Orlova, S. L.; Ptitsina, N. G. |
Measurement of the width of the cyclotron resonance line of n-type Ge in quantizing magnetic fields |
1972 |
Presumably: Sov. Phys. Semicond. | Физика и техника полупроводников |
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Gershenzon, E. M.; Gol’tsman, G. N.; Semenov, A. D.; Sergeev, A. V. |
Mechanism of picosecond response of granular YBaCuO films to electromagnetic radiation |
1991 |
IEEE Trans. Magn. |
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Gershenzon, E. M.; Gol'tsman, G. N.; Semenov, A. D.; Sergeev, A. V. |
Mechanism of picosecond response of granular YBaCuO films to electromagnetic radiation |
1990 |
Solid State Communications |
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Baubert, J.; Salez, M.; Delorme, Y.; Pons, P.; Goltsman, G.; Merkel, H.; Leconte, B. |
Membrane-based HEB mixer for THz applications |
2003 |
Proc. SPIE |
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Elmanov, I.; Elmanova, A.; Komrakova, S.; Golikov, A.; Kaurova, N.; Kovalyuk, V.; Goltsman, G.; Arakelyan, S.; Evlyukhin, A.; Kalachev, A.; Naumov, A. |
Method for determination of resists parameters for photonic – integrated circuits e-beam lithography on silicon nitride platform |
2019 |
EPJ Web Conf. |
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