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Kostiuk, T. (2003). Heterodyne spectroscopy in the thermal infrared region: a window on physics and chemistry. In University of Maryland Inn and Conference Center (Ed.), Proc. International Thermal Detectors Workshop (TDW'03), session 7 (Heterodyne detectors). 3501 University Boulevar East Adelphi, MD 20783.
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Gordon, N. T., Lees, D. J., Bowen, G., Phillips, T. S., Haigh, M., Jones, C. L., et al. (2006). HgCdTe detectors operating above 200 K. J. Electron. Mater., 35(6), 1140–1144.
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Minaeva, O., Fraine, A., Korneev, A., Divochiy, A., Goltsman, G., & Sergienko, A. (2012). High resolution optical time-domain reflectometry using superconducting single-photon detectors. In Frontiers in Opt. 2012/Laser Sci. XXVIII (Fw3a.39). Optical Society of America.
Abstract: We discuss the advantages and limitations of single-photon optical time-domain reflectometry with superconducting single-photon detectors. The higher two-point resolution can be achieved due to superior timing performance of SSPDs in comparison with InGaAs APDs.
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Anfertev, V., Vaks, V., Revin, L., Pentin, I., Tretyakov, I., Goltsman, G., et al. (2017). High resolution THz gas spectrometer based on semiconductor and superconductor devices. In EPJ Web Conf. (Vol. 132, 02001 (1 to 2)).
Abstract: The high resolution THz gas spectrometer consists of a synthesizer based on Gunn generator with a semiconductor superlattice frequency multiplier as a radiation source, and an NbN hot electron bolometer in a direct detection mode as a THz radiation receiver was presented. The possibility of application of a quantum cascade laser as a local oscillator for a heterodyne receiver which is based on an NbN hot electron bolometer mixer is shown. The ways for further developing of the THz spectroscopy were outlined.
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Verevkin, A. A., Ptitsina, N. G., Smirnov, K. V., Gol'tsman, G. N., Voronov, B. M., Gershenzon, E. M., et al. (1997). Hot electron bolometer detectors and mixers based on a superconducting-two-dimensional electron gas-superconductor structure. In Proc. 4-th Int. Semicond. Device Research Symp. (pp. 163–166).
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