Author |
Title |
Year |
Publication |
DOI |
Kovalyuk, V.; Ferrari, S.; Kahl, O.; Semenov, A.; Shcherbatenko, M.; Lobanov, Y.; Ozhegov, R.; Korneev, A.; Kaurova, N.; Voronov, B.; Pernice, W.; Gol'tsman, G. |
On-chip coherent detection with quantum limited sensitivity |
2017 |
Sci Rep |
10.1038/s41598-017-05142-1 |
Boyarskii, D. A.; Gershenzon, V. E.; Gershenzon, E. M.; Gol'tsman, G. N.; Ptitsina, N. G.; Tikhonov, V. V.; Chulkova, G. M. |
On the possibility of determining the microstructural parameters of an oil-bearing layer from radiophysical measurement data |
1996 |
J. of Communications Technology and Electronics |
|
Bell, M.; Kaurova, N.; Divochiy, A.; Gol'tsman, G.; Bird, J.; Sergeev, A.; Verevkin, A. |
On the nature of resistive transition in disordered superconducting nanowires |
2007 |
IEEE Trans. Appl. Supercond. |
10.1109/TASC.2007.898619 |
Schroeder, E.; Mauskopf, P.; Pilyavsky, G.; Sinclair, A.; Smith, N.; Bryan, S.; Mani, H.; Morozov, D.; Berggren, K.; Zhu, D.; Smirnov, K.; Vakhtomin, Y. |
On the measurement of intensity correlations from laboratory and astronomical sources with SPADs and SNSPDs |
2016 |
Proc. SPIE |
10.1117/12.2233536 |
Matyushkin, Y.; Kaurova, N.; Voronov, B.; Goltsman, G.; Fedorov, G. |
On chip carbon nanotube tunneling spectroscopy |
2020 |
Fullerenes, Nanotubes and Carbon Nanostructures |
10.1080/1536383x.2019.1671365 |
Gershenzon, E. M.; Gol'tsman, G. N.; Ptitsina, N. G. |
Observation of the free-exciton spectrum at submillimeter wavelengths |
1972 |
JETP Lett. |
|
Gershenzon, E. M.; Gol'tsman, G. N.; Kagane, M. L. |
Observation of free carrier resonances in p-type germanium at submillimeter wavelengths |
1978 |
Sov. Phys. Solid State |
|
Semenov, A. D.; Gol’tsman, G. N. |
Nonthermal mixing mechanism in a diffusion-cooled hot-electron detector |
2000 |
J. Appl. Phys. |
10.1063/1.371890 |
Gershenzon, E. M.; Gershenzon, M. E.; Gol'tsman, G. N.; Semenov, A. D.; Sergeev, A. V. |
Nonselective effect of electromagnetic radiation on a superconducting film in the resistive state |
1982 |
JETP Lett. |
|
Zhang, J.; Boiadjieva, N.; Chulkova, G.; Deslandes, H.; Gol'tsman, G. N.; Korneev, A.; Kouminov, P.; Leibowitz, M.; Lo, W.; Malinsky, R.; Okunev, O.; Pearlman, A.; Slysz, W.; Smirnov, K.; Tsao, C.; Verevkin, A.; Voronov, B.; Wilsher, K.; Sobolewski, R. |
Noninvasive CMOS circuit testing with NbN superconducting single-photon detectors |
2003 |
Electron. Lett. |
10.1049/el:20030710 |