| Author |
Title  |
Year |
Publication |
Volume |
Pages |
| Gayduchenko, I.; Xu, S. G.; Alymov, G.; Moskotin, M.; Tretyakov, I.; Taniguchi, T.; Watanabe, K.; Goltsman, G.; Geim, A. K.; Fedorov, G.; Svintsov, D.; Bandurin, D. A. |
Tunnel field-effect transistors for sensitive terahertz detection |
2021 |
Nat. Commun. |
12 |
543 |
| Sergeev, A. V.; Semenov, A. D.; Kouminov, P.; Trifonov, V.; Goghidze, I. G.; Karasik, B. S.; Gol’tsman, G. N.; Gershenzon, E. M. |
Transparency of a YBa2Cu3O7-film/substrate interface for thermal phonons measured by means of voltage response to radiation |
1994 |
Phys. Rev. B Condens. Matter. |
49 |
9091-9096 |
| Gershenzon, E. M.; Gol'tsman, G. N. |
Transitions of electrons between excited states of donors in germanium |
1971 |
JETP Lett. |
14 |
63-65 |
| Lindgren, M.; Trifonov, V.; Zorin, M.; Danerud, M.; Winkler, D.; Karasik, B. S.; Gol’tsman, G. N.; Gershenzon, E.M. |
Transient resistive photoresponse of YBa2Cu3O7−δ films using low power 0.8 and 10.6 μm laser radiation |
1994 |
Appl. Phys. Lett. |
64 |
3036-3038 |
| Beck, M.; Rousseau, I.; Klammer, M.; Leiderer, P.; Mittendorff, M.; Winnerl, S.; Helm, M.; Gol'tsman, G.N.; Demsar, J. |
Transient increase of the energy gap of superconducting NbN thin films excited by resonant narrow-band terahertz pulses |
2013 |
Phys. Rev. Lett. |
110 |
267003 (1 to 5) |
| Galin, M. A.; Klushin, A. M.; Kurin, V. V.; Seliverstov, S. V.; Finkel, M. I.; Goltsman, G. N.; Müller, F.; Scheller, T.; Semenov, A. D. |
Towards local oscillators based on arrays of niobium Josephson junctions |
2015 |
Supercond. Sci. Technol. |
28 |
055002 (1 to 7) |
| Sidorova, M.; Semenov, A.; Hübers, H.-W.; Kuzmin, A.; Doerner, S.; Ilin, K.; Siegel, M.; Charaev, I.; Vodolazov, D. |
Timing jitter in photon detection by straight superconducting nanowires: Effect of magnetic field and photon flux |
2018 |
Phys. Rev. B |
98 |
134504 (1 to 14) |
| Vodolazov, D. Y.; Manova, N. N.; Korneeva, Y. P.; Korneev, A. A. |
Timing jitter in NbN superconducting microstrip single-photon detector |
2020 |
Phys. Rev. Applied |
14 |
044041 (1 to 8) |
| Elvira, D.; Michon, A.; Fain, B.; Patriarche, G.; Beaudoin, G.; Robert-Philip, I.; Vachtomin, Y.; Divochiy, A. V.; Smirnov, K. V.; Gol’tsman, G. N.; Sagnes, I.; Beveratos, A. |
Time-resolved spectroscopy of InAsP/InP(001) quantum dots emitting near 2 μm |
2010 |
Appl. Phys. Lett. |
97 |
131907 (1 to 3) |
| Lobanov, Y. V.; Vakhtomin, Y. B.; Pentin, I. V.; Rosental, V. A.; Smirnov, K. V.; Goltsman, G. N.; Volkov, O. Y.; Dyuzhikov, I. N.; Galiev, R. R.; Ponomarev, D. S.; Khabibullin, R. A. |
Time-resolved measurements of light–current characteristic and mode competition in pulsed THz quantum cascade laser |
2021 |
Optical Engineering |
60 |
1-8 |
| Hübers, H.-W.; Semenov, A.; Holldack, K.; Schade, U.; Wüstefeld, G.; Gol’tsman, G. |
Time domain analysis of coherent terahertz synchrotron radiation |
2005 |
Appl. Phys. Lett. |
87 |
184103 (1 to 3) |
| Zhang, J.; Słysz, W.; Pearlman, A.; Verevkin, A.; Sobolewski, R.; Okunev, O.; Chulkova, G.; Gol’tsman, G. N. |
Time delay of resistive-state formation in superconducting stripes excited by single optical photons |
2003 |
Phys. Rev. B |
67 |
132508 (1 to 4) |
| Shurakov, A.; Mikhalev, P.; Mikhailov, D.; Mityashkin, V.; Tretyakov, I.; Kardakova, A.; Belikov, I.; Kaurova, N.; Voronov, B.; Vasil’evskii, I.; Gol’tsman, G. |
Ti/Au/n-GaAs planar Schottky diode with a moderately Si-doped matching sublayer |
2018 |
Microelectronic Engineering |
195 |
26-31 |
| Gorokhov, G.; Bychanok, D.; Gayduchenko, I.; Rogov, Y.; Zhukova, E.; Zhukov, S.; Kadyrov, L.; Fedorov, G.; Ivanov, E.; Kotsilkova, R.; Macutkevic, J.; Kuzhir, P. |
THz spectroscopy as a versatile tool for filler distribution diagnostics in polymer nanocomposites |
2020 |
Polymers (Basel) |
12 |
3037 (1 to 14) |
| Zvagelsky, R. D.; Chubich, D. A.; Kolymagin, D. A.; Korostylev, E. V.; Kovalyuk, V. V.; Prokhodtsov, A. I.; Tarasov, A. V.; Goltsman, G. N.; Vitukhnovsky, A. G. |
Three-dimensional polymer wire bonds on a chip: morphology and functionality |
2020 |
J. Phys. D: Appl. Phys. |
53 |
355102 |
