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Citations
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Il'in, K. S., Lindgren, M., Currie, M. A., Semenov, D., Gol'tsman, G. N., Sobolewski, R., et al. (2000). Picosecond hot-electron energy relaxation in NbN superconducting photodetectors. Appl. Phys. Lett., 76(19), 2752–2754.
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Floet D. W., Gao J. R., Klapwijk T. M., & de Korte P. A. J. (2000). Bias Dependence of the Thermal Time Constant in Nb Superconducting Diffusion-Cooled HEB Mixers. Appl. Phys. Lett., 77, 1719.
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Manus, M. K. M., Kash, J. A., Steen, S. E., Polonsky, S., Tsang, J. C., Knebel, D. R., et al. (2000). PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis. Microelectronics Reliability, 40, 1353–1358.
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Cherednichenko, S., Rönnung, F., Gol'tsman, G., Kollberg, E., & Winkler, D. (2000). YBa2Cu3O7−δ hot-electron bolometer mixer. Phys. C: Supercond., 341-348, 2653–2654.
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Semenov, A. D., & Gol’tsman, G. N. (2000). Nonthermal mixing mechanism in a diffusion-cooled hot-electron detector. J. Appl. Phys., 87(1), 502–510.
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