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Il'in, K. S.; Lindgren, M.; Currie, M. A.; Semenov, D.; Gol'tsman, G. N.; Sobolewski, Roman; Cherednichenko, S. I.; Gershenzon, E. M. Picosecond hot-electron energy relaxation in NbN superconducting photodetectors 2000 Appl. Phys. Lett. 76 2752-2754 details   doi
Floet D. W.; Gao J. R.; Klapwijk T. M.; de Korte P. A. J. Bias Dependence of the Thermal Time Constant in Nb Superconducting Diffusion-Cooled HEB Mixers 2000 Appl. Phys. Lett. 77 1719 details   doi
Manus, M. K. Mc; Kash, J. A.; Steen, S. E.; Polonsky, S.; Tsang, J.C.; Knebel, D. R.; Huott, W. PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis 2000 Microelectronics Reliability 40 1353-1358 details   doi
Cherednichenko, S.; Rönnung, F.; Gol'tsman, G.; Kollberg, E.; Winkler, D. YBa2Cu3O7−δ hot-electron bolometer mixer 2000 Phys. C: Supercond. 341-348 2653-2654 details   doi
Semenov, A. D.; Gol’tsman, G. N. Nonthermal mixing mechanism in a diffusion-cooled hot-electron detector 2000 J. Appl. Phys. 87 502-510 details   doi
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