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Author |
Корнеев, А. А.; Минаева, О.; Рубцова, И.; Милостная, И.; Чулкова, Г.; Воронов, Б.; Смирнов, К.; Селезнёв, В.; Гольцман, Г.; Pearlman, A.; Slysz, W.; Cross, A.; Alvarez, P.; Верёвкин, А.; Sobolewski, R. |
Title |
Сверхпроводящий однофотонный детектор на основе ультратонкой пленки NbN |
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Journal Article |
Year |
2005 |
Publication |
Квантовая электроника |
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35 |
Issue |
8 |
Pages |
698-700 |
Keywords |
NbN SSPD, SNSPD |
Abstract |
Представлены результаты исследований сверхпроводящих однофотонных детекторов, изготовленных из ультратонкой пленки NbN. Развитие технологического процесса изготовления детекторов, а также снижение рабочей температуры до 2 К позволили существенно увеличить квантовую эффективность: для видимого света (λ = 0.56 мкм) она составила 30%–40%, т.е. достигла предела, определяемого коэффициентом поглощения пленки. С ростом длины волны квантовая эффективность экспоненциально падает, составляя ~20% на λ=1.55 мкм и ~0.02% на λ = 5 мкм. При скорости темнового счета ~10-4s-1 экспериментально измеренная эквивалентная мощность шума составила 1.5 × 10-20 Вт/Гц-1/2; в дальнейшем она может быть уменьшена до рекордно низкого значения 5 × 10-21 Вт/Гц-1/2. Временное разрешение детектора равно 30 пс. |
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Russian |
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Duplicated as 383 (Superconducting single-photon ultrathin NbN film detector) |
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382 |
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Hajenius, M.; Baselmans, J. J. A.; Baryshev, A.; Gao, J. R.; Klapwijk, T. M.; Kooi, J. W.; Jellema, W.; Yang, Z. Q. |
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Full characterization and analysis of a terahertz heterodyne receiver based on a NbN hot electron bolometer |
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2006 |
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J. Appl. Phys. |
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100 |
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7 |
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074507 |
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HEB |
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0021-8979 |
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RPLAB @ s @ |
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385 |
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Korneev, A.; Minaeva, O.; Rubtsova, I.; Milostnaya, I.; Chulkova, G.; Voronov, B.; Smirnov, K.; Seleznev, V.; Gol'tsman, G.; Pearlman, A.; Slysz, W.; Cross, A.; Alvarez, P.; Verevkin, A.; Sobolewski, R. |
Title |
Superconducting single-photon ultrathin NbN film detector |
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Journal Article |
Year |
2005 |
Publication |
Quantum Electronics |
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35 |
Issue |
8 |
Pages |
698-700 |
Keywords |
NbN SSPD, SNSPD |
Abstract |
Superconducting single-photon ultrathin NbN film detectors are studied. The development of manufacturing technology of detectors and the reduction of their operating temperature down to 2 K resulted in a considerable increase in their quantum efficiency, which reached in the visible region (at 0.56 μm) 30%—40%, i.e., achieved the limit determined by the absorption coefficient of the film. The quantum efficiency exponentially decreases with increasing wavelength, being equal to ~20% at 1.55 μm and ~0.02% at 5 μm. For the dark count rate of ~10-4s-1, the experimental equivalent noise power was 1.5×10-20 W Hz-1/2; it can be decreased in the future down to the record low value of 5×10-21 W Hz-1/2. The time resolution of the detector is 30 ps. |
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Сверхпроводящий однофотонный детектор на основе ультратонкой пленки NbN |
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383 |
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Kenyon, M.; Day, P. K.; Bradford, C. M.; Bock, J. J.; Leduc, H. G. |
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Background-limited membrane-isolated TES bolometers for far-IR/submillimeter direct-detection spectroscopy |
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2006 |
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Nucl. Instr. & Meth. Phys. Res. A |
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559 |
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456-458 |
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RPLAB @ s @ TES_NEP_1e_19 |
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384 |
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Rosfjord, Kristine M.; Yang, Joel K. W.; Dauler, Eric A.; Kerman, Andrew J.; Vikas Anant; Voronov, Boris M.; Gol'tsman, Gregory N.; Berggren, Karl K. |
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Nanowire Single-photon detector with an integrated optical cavity and anti-reflection coating |
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2006 |
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Opt. Express |
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Opt. Express |
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14 |
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2 |
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527-534 |
Keywords |
SSPD, SNSPD, cavity |
Abstract |
We have fabricated and tested superconducting single-photon detectors and demonstrated detection efficiencies of 57% at 1550-nm wavelength and 67% at 1064 nm. In addition to the peak detection efficiency, a median detection efficiency of 47.7% was measured over 132 devices at 1550 nm. These measurements were made at 1.8K, with each device biased to 97.5% of its critical current. The high detection efficiencies resulted from the addition of an optical cavity and anti-reflection coating to a nanowire photodetector, creating an integrated nanoelectrophotonic device with enhanced performance relative to the original device. Here, the testing apparatus and the fabrication process are presented. The detection efficiency of devices before and after the addition of optical elements is also reported. |
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1094-4087 |
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PMID:19503367 |
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388 |
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