| Author |
Title |
Year |
Publication |
Volume |
Pages |
| Korneeva, Y. P.; Mikhailov, M. Y.; Pershin, Y. P.; Manova, N. N.; Divochiy, A. V.; Vakhtomin, Y. B.; Korneev, A. A.; Smirnov, K. V.; Sivakov, A. G.; Devizenko, A. Y.; Goltsman, G. N. |
Superconducting single-photon detector made of MoSi film |
2014 |
Supercond. Sci. Technol. |
27 |
095012 |
| Takemoto, K.; Nambu, Y.; Miyazawa, T.; Sakuma, Y.; Yamamoto, T.; Yorozu, S.; Arakawa, Y. |
Quantum key distribution over 120 km using ultrahigh purity single-photon source and superconducting single-photon detectors |
2015 |
Sci. Rep. |
5 |
14383 |
| Sidorova, Maria V.; Divochiy, Alexander V.; Vakhtomin, Yury B.; Smirnov, Konstantin V. |
Ultrafast superconducting single-photon detector with a reduced active area coupled to a tapered lensed single-mode fiber |
2015 |
J. Nanophoton. |
9 |
093051 |
| McCarthy, Aongus; Krichel, Nils J.; Gemmell, Nathan R.; Ren, Ximing; Tanner, Michael G.; Dorenbos, Sander N.; Zwiller, Val; Hadfield, Robert H.; Buller, Gerald S. |
Kilometer-range, high resolution depth imaging via 1560 nm wavelength single-photon detection |
2013 |
Opt. Express |
21 |
8904-8915 |
| Manus, M. K. Mc; Kash, J. A.; Steen, S. E.; Polonsky, S.; Tsang, J.C.; Knebel, D. R.; Huott, W. |
PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis |
2000 |
Microelectronics Reliability |
40 |
1353-1358 |
