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Ekström, H., Karasik, B., Kollberg, E., Gol'tsman, G., & Gershenzon, E. (1995). 350 GHz NbN hot electron bolometer mixer. In Proc. 6th Int. Symp. Space Terahertz Technol. (pp. 269–283).
Abstract: Superconducting NbN hot-electron bolometer (HEB) mixer devices have been fabricated and measured at 350 GHz. The HEB is integrated with a double dipole antenna on an extended crystalline quartz hyper hemispherical substrate lens. Heterodyne measurement gave a -3 dB bandwidth, mainly determined by the electron- phonon interaction time, of about 680 and 1000 MHz for two different films with Tc = 8.5 and 11 K respectively. The measured DSB receiver noise temperature is around 3000 K at 800 MHz IF frequency. The main contribution to the output noise from the device is due to electron temperature fluctuations with the equivalent output noise temperature TFL-100 K. TH, has the same frequency dependence as the IF response. The contribution from Johnson noise is of the order of T. The RF coupling loss is estimated to be = 6 dB. The film with lower Tc, had an estimated intrinsic low-frequency conversion loss = 7 dB, while the other film had a conversion loss as high as 14 dB. The difference in intrinsic conversion loss is explained by less uniform absorption of radiation. Measurements of the small signal impedance shows a transition of the output impedance from the DC differential resistance Rd=dV/dI in the low frequency limit to the DC resistance R 0 =Uoff 0 in the bias point for frequencies above 3 GHz. We judge that the optimum shape of the IV-characteristic is more easily obtained at THz frequencies where the main restriction in performance should come from problems with the RF coupling.
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Gerecht, E., Musante, C. F., Schuch, R., Lutz, C. R., Jr., Yngvesson, K. S., et al. (1995). Hot electron detection and mixing experiments in NbN at 119 micrometer wavelength. In Proc. 6th Int. Symp. Space Terahertz Technol. (pp. 284–293).
Abstract: We have performed preliminary experiments with the goal of demonstrating a Hot Electron Bolometric (HEB) mixer for a 119 micrometer wavelength (2.5 THz). We have chosen a NbN device of size 700 x 350 micrometers. This device can easily be coupled to a laser LO source, which is advantageous for performing a prototype experiment. The relatively large size of the device means that the LO power required is in the mW range; this power can be easily obtained from a THz laser source. We have measured the amount of laser power actually absorbed in the device, and from this have estimated the best optical coupling loss to be about 10 di . We are developing methods for improving the optical coupling further. Preliminary measurements of the response of the device to a chopped black-body have not yet resulted in a measured receiver noise temperature. We expect to be able to complete this measurement in the near future.
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Gol'tsman, G. N., Karasik, B. S., Okunev, O. V., Dzardanov, A. L., Gershenzon, E. M., Ekstrom, H., et al. (1995). NbN hot electron superconducting mixers for 100 GHz operation. IEEE Trans. Appl. Supercond., 5(2), 3065–3068.
Abstract: NbN is a promising superconducting material for hot-electron superconducting mixers with an IF bandwidth larger than 1 GHz. In the 1OO GHz frequency range, the following parameters were obtained for 50 /spl Aring/ thick NbN films at 4.2 K: receiver noise temperature (DSB) /spl sim/1000 K; conversion loss /spl sim/10 dB; IF bandwidth /spl sim/1 GHz; and local oscillator power /spl sim/1 /spl mu/W. An increase of the critical current of the NbN film, increased working temperature, and a better mixer matching may allow a broader IF bandwidth up to 2 GHz, reduced conversion losses down to 3-5 dB and a receiver noise temperature (DSB) down to 200-300 K.
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Hans Ekstrom, Karasik, B. S., Kollberg, E. L., & Sigfrid Yngvesson. (1995). Conversion gain and noise of niobium superconducting hot–electron–mixers. IEEE Trans. Appl. Supercond., 43(4), 938–947.
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Kerr, A. R. (1995). Some fundamental and practical limits on broadband matching tocapacitive devices, and the implications for SIS mixer design. IEEE Trans. Microw. Theory Techn., 43(1), 2–13.
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