Author |
Title |
Year |
Publication |
Volume |
Pages |
Il'in, K. S.; Lindgren, M.; Currie, M. A.; Semenov, D.; Gol'tsman, G. N.; Sobolewski, Roman; Cherednichenko, S. I.; Gershenzon, E. M. |
Picosecond hot-electron energy relaxation in NbN superconducting photodetectors |
2000 |
Appl. Phys. Lett. |
76 |
2752-2754 |
Floet D. W.; Gao J. R.; Klapwijk T. M.; de Korte P. A. J. |
Bias Dependence of the Thermal Time Constant in Nb Superconducting Diffusion-Cooled HEB Mixers |
2000 |
Appl. Phys. Lett. |
77 |
1719 |
Manus, M. K. Mc; Kash, J. A.; Steen, S. E.; Polonsky, S.; Tsang, J.C.; Knebel, D. R.; Huott, W. |
PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis |
2000 |
Microelectronics Reliability |
40 |
1353-1358 |
Cherednichenko, S.; Rönnung, F.; Gol'tsman, G.; Kollberg, E.; Winkler, D. |
YBa2Cu3O7−δ hot-electron bolometer mixer |
2000 |
Phys. C: Supercond. |
341-348 |
2653-2654 |
Semenov, A. D.; Gol’tsman, G. N. |
Nonthermal mixing mechanism in a diffusion-cooled hot-electron detector |
2000 |
J. Appl. Phys. |
87 |
502-510 |