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Gol'tsman, G. N., & Loudkov, D. N. (2003). Terahertz superconducting hot-electron bolometer mixers and their application in radio astronomy. Radiophys. Quant. Electron., 46(8/9), 604–617.
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Гольцман, Г. Н., & Лудков, Д. Н. (2003). Сверхпроводниковые смесители на горячих электронах терагерцового диапазона и их применение в радиоастрономии. Изв. высших учебных заведений. Радиофизика, 46(8/9).
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Vystavkin, A. N. (1999). Estimation of noise equivalent power and design analysis of an andreev reflection hot-electron microbolometer for submillimeter radioastronomy. Rus. J. Radio Electron., (10).
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Semenov, A. D., Il'in, K., Siegel, M., Smirnov, A., Pavlov, S., Richter, H., et al. (2006). Evidence of non-bolometric mixing in the bandwidth of a hot-electron bolometer. Supercond. Sci. Technol., 19(10), 1051–1056.
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Semenov, A. D., Richter, H., Hubers, H. - W., Gunther, B., Smirnov, A., Il'in, K. S., et al. (2007). Terahertz performance of integrated lens antennas with a hot-electron bolometer. IEEE Trans. Microw. Theory Techn., 55(2), 239–247.
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Baselmans, J. J. A., Hajenius, M., Gao, J. R., Baryshev, A., Kooi, J., Klapwijk, T. M., et al. (2005). NbN hot electron bolometer mixers: sensitivity, LO power, direct detection and stability. IEEE Trans. Appl. Supercond., 15(2), 484–489.
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Uzawa, Y., Miki, S., Wang, Z., Kawakami, A., Kroug, M., Yagoubov, P., et al. (2002). Performance of a quasi-optical NbN hot-electron bolometric mixer at terahertz frequencies. Supercond. Sci. Technol., 15(1), 141–145.
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Cherednichenko, S., & Drakinskiy, V. (2008). Low noise hot-electron bolometer mixers for terahertz frequencies. J. Low Temp. Phys., 151(1-2), 575–579.
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Schwaab, G. W., Sirmain, G., Schubert, J., Hubers, H. - W., Gol'tsman, G., Cherednichenko, S., et al. (1999). Investigation of NbN phonon-cooled HEB mixers at 2.5 THz. IEEE Trans. Appl. Supercond., 9(2), 4233–4236.
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Meledin, D., Pavolotsky, A., Desmaris, V., Lapkin, I., Risacher, C., Perez, V., et al. (2009). A 1.3-THz balanced waveguide HEB mixer for the APEX telescope. IEEE Trans. Microw. Theory Techn., 57(1), 89–98.
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